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Thomas, Ch., Heiderhoff, R., Balk, L. J. (2007) 200 femtometer sensitivity for near-field analysis of surface acoustic waves in a scanning electron / scanning probe microscope hybrid system. Applied Physics Letters, 90 (14). 144106pp. doi:10.1063/1.2721123

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Reference TypeJournal (article/letter/editorial)
Title200 femtometer sensitivity for near-field analysis of surface acoustic waves in a scanning electron / scanning probe microscope hybrid system
JournalApplied Physics Letters
AuthorsThomas, Ch.Author
Heiderhoff, R.Author
Balk, L. J.Author
Year2007 (April 2)Volume90
Issue14
PublisherAIP Publishing
DOIdoi:10.1063/1.2721123Search in ResearchGate
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Mindat Ref. ID8553312Long-form Identifiermindat:1:5:8553312:9
GUID0
Full ReferenceThomas, Ch., Heiderhoff, R., Balk, L. J. (2007) 200 femtometer sensitivity for near-field analysis of surface acoustic waves in a scanning electron / scanning probe microscope hybrid system. Applied Physics Letters, 90 (14). 144106pp. doi:10.1063/1.2721123
Plain TextThomas, Ch., Heiderhoff, R., Balk, L. J. (2007) 200 femtometer sensitivity for near-field analysis of surface acoustic waves in a scanning electron / scanning probe microscope hybrid system. Applied Physics Letters, 90 (14). 144106pp. doi:10.1063/1.2721123
In(2007, April) Applied Physics Letters Vol. 90 (14) AIP Publishing

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Joachimsthaler, I, Heiderhoff, R, Balk, L J (2003) A universal scanning-probe-microscope-based hybrid system. Measurement Science and Technology, 14. 87-96 doi:10.1088/0957-0233/14/1/313
Thomas, Ch, Heiderhoff, R, Balk, L J (2007) Acoustic near-field conditions in an ESEM/AFM hybrid system. Journal of Physics: Conference Series, 61. 1180-1185 doi:10.1088/1742-6596/61/1/233
Balk, L.J., Heiderhoff, R., Phang, J.C.H., Thomas, Ch. (2007) Characterization of electronic materials and devices by scanning near-field microscopy. Applied Physics A, 87. 443-449 doi:10.1007/s00339-007-3910-3
Cramer, R. M., Heiderhoff, R., Balk, L. J. (2006) Scanning near-field cathodoluminescence investigations. Scanning, 20 (6). 433-435 doi:10.1002/sca.1998.4950200602
ALTES, A., HEIDERHOFF, R., BALK, L. J. (2002) COMPLEMENTARY SURFACE INVESTIGATION OF DIAMOND BY SCANNING THERMAL MICROSCOPY AND SCANNING NEAR-FIELD CATHODOLUMINESCENCE. International Journal of Modern Physics B, 16 (6). 895-899 doi:10.1142/s0217979202010579
Liu, X X, Heiderhoff, R, Abicht, H P, Balk, L J (2002) Scanning near-field acoustic study of ferroelectric BaTiO3ceramics. Journal of Physics D: Applied Physics, 35. 74-87 doi:10.1088/0022-3727/35/1/313
Eberharter, G., Feuerbaum, H.P. (1980) Scanning‐electron‐microscope observations of propagating acoustic waves in surface acoustic wave devices. Applied Physics Letters, 37 (8). 698-699 doi:10.1063/1.92044
Thomas, Ch, Joachimsthaler, I, Heiderhoff, R, Balk, L J (2004) Electron-beam-induced potentials in semiconductors: calculation and measurement with an SEM/SPM hybrid system. Journal of Physics D: Applied Physics, 37. 2785-2794 doi:10.1088/0022-3727/37/20/003
Liu, X.X., Heiderhoff, R., Abicht, H.P., Balk, L.J. (2002) Dynamic characterization of ferroelectric domains of BaTiO3 by scanning near-field acoustic microscopy. Materials Chemistry and Physics, 75. 125-130 doi:10.1016/s0254-0584(02)00065-2
van Agterveld, D. T. L., Palasantzas, G., De Hosson, J. Th. M. (1999) Surface sensitivity effects with local probe scanning Auger–scanning electron microscopy. Applied Physics Letters, 75 (8). 1080-1082 doi:10.1063/1.124603
INOUYE, Y., KAWATA, S. (1995) A scanning near-field optical microscope having scanning electron tunnelling microscope capability using a single metallic probe tip. Journal of Microscopy, 178 (1). 14-19 doi:10.1111/j.1365-2818.1995.tb03575.x
 
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