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Imtiaz, Atif, Anlage, Steven M., Barry, John D., Melngailis, John (2007) Nanometer-scale material contrast imaging with a near-field microwave microscope. Applied Physics Letters, 90 (14). 143106pp. doi:10.1063/1.2719164

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Reference TypeJournal (article/letter/editorial)
TitleNanometer-scale material contrast imaging with a near-field microwave microscope
JournalApplied Physics Letters
AuthorsImtiaz, AtifAuthor
Anlage, Steven M.Author
Barry, John D.Author
Melngailis, JohnAuthor
Year2007 (April 2)Volume90
Issue14
PublisherAIP Publishing
DOIdoi:10.1063/1.2719164Search in ResearchGate
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Mindat Ref. ID8553231Long-form Identifiermindat:1:5:8553231:5
GUID0
Full ReferenceImtiaz, Atif, Anlage, Steven M., Barry, John D., Melngailis, John (2007) Nanometer-scale material contrast imaging with a near-field microwave microscope. Applied Physics Letters, 90 (14). 143106pp. doi:10.1063/1.2719164
Plain TextImtiaz, Atif, Anlage, Steven M., Barry, John D., Melngailis, John (2007) Nanometer-scale material contrast imaging with a near-field microwave microscope. Applied Physics Letters, 90 (14). 143106pp. doi:10.1063/1.2719164
In(2007, April) Applied Physics Letters Vol. 90 (14) AIP Publishing

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Imtiaz, Atif, Pollak, Marc, Anlage, Steven M., Barry, John D., Melngailis, John (2005) Near-field microwave microscopy on nanometer length scales. Journal of Applied Physics, 97 (4). 44302pp. doi:10.1063/1.1844614
Imtiaz, Atif, Anlage, Steven M. (2006) Effect of tip geometry on contrast and spatial resolution of the near-field microwave microscope. Journal of Applied Physics, 100 (4). 44304pp. doi:10.1063/1.2234801
Imtiaz, Atif, Baldwin, Thomas, Nembach, Hans T., Wallis, Thomas M., Kabos, Pavel (2007) Near-field microwave microscope measurements to characterize bulk material properties. Applied Physics Letters, 90 (24). 243105pp. doi:10.1063/1.2748307
Imtiaz, Atif, Anlage, Steven M. (2003) A novel STM-assisted microwave microscope with capacitance and loss imaging capability. Ultramicroscopy, 94 (3). 209-216 doi:10.1016/s0304-3991(02)00291-7
Steinhauer, D. E., Vlahacos, C. P., Dutta, S. K., Wellstood, F. C., Anlage, Steven M. (1997) Surface resistance imaging with a scanning near-field microwave microscope. Applied Physics Letters, 71 (12). 1736-1738 doi:10.1063/1.120020
Vlahacos, C. P., Steinhauer, D. E., Dutta, S. K., Feenstra, B. J., Anlage, Steven M., Wellstood, F. C. (1998) Quantitative topographic imaging using a near-field scanning microwave microscope. Applied Physics Letters, 72 (14). 1778-1780 doi:10.1063/1.121182
Steinhauer, D. E., Vlahacos, C. P., Wellstood, F. C., Anlage, Steven M., Canedy, C., Ramesh, R., Stanishevsky, A., Melngailis, J. (2000) Quantitative imaging of dielectric permittivity and tunability with a near-field scanning microwave microscope. Review of Scientific Instruments, 71 (7). 2751-2758 doi:10.1063/1.1150687
Steinhauer, D. E., Vlahacos, C. P., Dutta, S. K., Feenstra, B. J., Wellstood, F. C., Anlage, Steven M. (1998) Quantitative imaging of sheet resistance with a scanning near-field microwave microscope. Applied Physics Letters, 72 (7). 861-863 doi:10.1063/1.120918
Lee, Sheng-Chiang, Vlahacos, C. P., Feenstra, B. J., Schwartz, Andrew, Steinhauer, D. E., Wellstood, F. C., Anlage, Steven M. (2000) Magnetic permeability imaging of metals with a scanning near-field microwave microscope. Applied Physics Letters, 77 (26). 4404-4406 doi:10.1063/1.1332978
Tselev, Alexander, Anlage, Steven M., Ma, Zhengkun, Melngailis, John (2007) Broadband dielectric microwave microscopy on micron length scales. Review of Scientific Instruments, 78 (4). 44701pp. doi:10.1063/1.2719613
Dutta, S. K., Vlahacos, C. P., Steinhauer, D. E., Thanawalla, Ashfaq S., Feenstra, B. J., Wellstood, F. C., Anlage, Steven M., Newman, Harvey S. (1999) Imaging microwave electric fields using a near-field scanning microwave microscope. Applied Physics Letters, 74 (1). 156-158 doi:10.1063/1.123137
 
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