King, P. D. C., Veal, T. D., Jefferson, P. H., McConville, C. F., Wang, T., Parbrook, P. J., Lu, Hai, Schaff, W. J. (2007) Valence band offset of InN∕AlN heterojunctions measured by x-ray photoelectron spectroscopy. Applied Physics Letters, 90 (13). 132105pp. doi:10.1063/1.2716994
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Valence band offset of InN∕AlN heterojunctions measured by x-ray photoelectron spectroscopy | ||
| Journal | Applied Physics Letters | ||
| Authors | King, P. D. C. | Author | |
| Veal, T. D. | Author | ||
| Jefferson, P. H. | Author | ||
| McConville, C. F. | Author | ||
| Wang, T. | Author | ||
| Parbrook, P. J. | Author | ||
| Lu, Hai | Author | ||
| Schaff, W. J. | Author | ||
| Year | 2007 (March 26) | Volume | 90 |
| Issue | 13 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.2716994Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8553121 | Long-form Identifier | mindat:1:5:8553121:9 |
| GUID | 0 | ||
| Full Reference | King, P. D. C., Veal, T. D., Jefferson, P. H., McConville, C. F., Wang, T., Parbrook, P. J., Lu, Hai, Schaff, W. J. (2007) Valence band offset of InN∕AlN heterojunctions measured by x-ray photoelectron spectroscopy. Applied Physics Letters, 90 (13). 132105pp. doi:10.1063/1.2716994 | ||
| Plain Text | King, P. D. C., Veal, T. D., Jefferson, P. H., McConville, C. F., Wang, T., Parbrook, P. J., Lu, Hai, Schaff, W. J. (2007) Valence band offset of InN∕AlN heterojunctions measured by x-ray photoelectron spectroscopy. Applied Physics Letters, 90 (13). 132105pp. doi:10.1063/1.2716994 | ||
| In | (2007, March) Applied Physics Letters Vol. 90 (13) AIP Publishing | ||
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