Juillaguet, S., Camassel, J., Albrecht, M., Chassagne, T. (2007) Screening the built-in electric field in 4H silicon carbide stacking faults. Applied Physics Letters, 90 (11). 111902pp. doi:10.1063/1.2713169
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Screening the built-in electric field in 4H silicon carbide stacking faults | ||
| Journal | Applied Physics Letters | ||
| Authors | Juillaguet, S. | Author | |
| Camassel, J. | Author | ||
| Albrecht, M. | Author | ||
| Chassagne, T. | Author | ||
| Year | 2007 (March 12) | Volume | 90 |
| Issue | 11 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.2713169Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8552871 | Long-form Identifier | mindat:1:5:8552871:0 |
| GUID | 0 | ||
| Full Reference | Juillaguet, S., Camassel, J., Albrecht, M., Chassagne, T. (2007) Screening the built-in electric field in 4H silicon carbide stacking faults. Applied Physics Letters, 90 (11). 111902pp. doi:10.1063/1.2713169 | ||
| Plain Text | Juillaguet, S., Camassel, J., Albrecht, M., Chassagne, T. (2007) Screening the built-in electric field in 4H silicon carbide stacking faults. Applied Physics Letters, 90 (11). 111902pp. doi:10.1063/1.2713169 | ||
| In | (2007, March) Applied Physics Letters Vol. 90 (11) AIP Publishing | ||
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