Wei, Wei, Parker, S. L., Sun, Y.-M., White, J. M., Xiong, Gang, Joly, Alan G., Beck, Kenneth M., Hess, Wayne P. (2007) Study of copper diffusion through a ruthenium thin film by photoemission electron microscopy. Applied Physics Letters, 90 (11). 111906pp. doi:10.1063/1.2712832
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Study of copper diffusion through a ruthenium thin film by photoemission electron microscopy | ||
| Journal | Applied Physics Letters | ||
| Authors | Wei, Wei | Author | |
| Parker, S. L. | Author | ||
| Sun, Y.-M. | Author | ||
| White, J. M. | Author | ||
| Xiong, Gang | Author | ||
| Joly, Alan G. | Author | ||
| Beck, Kenneth M. | Author | ||
| Hess, Wayne P. | Author | ||
| Year | 2007 (March 12) | Volume | 90 |
| Issue | 11 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.2712832Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8552842 | Long-form Identifier | mindat:1:5:8552842:8 |
| GUID | 0 | ||
| Full Reference | Wei, Wei, Parker, S. L., Sun, Y.-M., White, J. M., Xiong, Gang, Joly, Alan G., Beck, Kenneth M., Hess, Wayne P. (2007) Study of copper diffusion through a ruthenium thin film by photoemission electron microscopy. Applied Physics Letters, 90 (11). 111906pp. doi:10.1063/1.2712832 | ||
| Plain Text | Wei, Wei, Parker, S. L., Sun, Y.-M., White, J. M., Xiong, Gang, Joly, Alan G., Beck, Kenneth M., Hess, Wayne P. (2007) Study of copper diffusion through a ruthenium thin film by photoemission electron microscopy. Applied Physics Letters, 90 (11). 111906pp. doi:10.1063/1.2712832 | ||
| In | (2007, March) Applied Physics Letters Vol. 90 (11) AIP Publishing | ||
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