Hwang, D. K., Lee, Kimoon, Kim, Jae Hoon, Im, Seongil, Park, Ji Hoon, Kim, Eugene (2006) Comparative studies on the stability of polymer versus SiO2 gate dielectrics for pentacene thin-film transistors. Applied Physics Letters, 89 (9). 93507pp. doi:10.1063/1.2345243
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Comparative studies on the stability of polymer versus SiO2 gate dielectrics for pentacene thin-film transistors | ||
| Journal | Applied Physics Letters | ||
| Authors | Hwang, D. K. | Author | |
| Lee, Kimoon | Author | ||
| Kim, Jae Hoon | Author | ||
| Im, Seongil | Author | ||
| Park, Ji Hoon | Author | ||
| Kim, Eugene | Author | ||
| Year | 2006 (August 28) | Volume | 89 |
| Issue | 9 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.2345243Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8552559 | Long-form Identifier | mindat:1:5:8552559:1 |
| GUID | 0 | ||
| Full Reference | Hwang, D. K., Lee, Kimoon, Kim, Jae Hoon, Im, Seongil, Park, Ji Hoon, Kim, Eugene (2006) Comparative studies on the stability of polymer versus SiO2 gate dielectrics for pentacene thin-film transistors. Applied Physics Letters, 89 (9). 93507pp. doi:10.1063/1.2345243 | ||
| Plain Text | Hwang, D. K., Lee, Kimoon, Kim, Jae Hoon, Im, Seongil, Park, Ji Hoon, Kim, Eugene (2006) Comparative studies on the stability of polymer versus SiO2 gate dielectrics for pentacene thin-film transistors. Applied Physics Letters, 89 (9). 93507pp. doi:10.1063/1.2345243 | ||
| In | (2006, August) Applied Physics Letters Vol. 89 (9) AIP Publishing | ||
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