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Ziegler, Mathias, Weik, Fritz, Tomm, Jens W., Elsaesser, Thomas, Nakwaski, Włodzimierz, Sarzała, Robert P., Lorenzen, Dirk, Meusel, Jens, Kozłowska, Anna (2006) Transient thermal properties of high-power diode laser bars. Applied Physics Letters, 89 (26). 263506pp. doi:10.1063/1.2424644

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Reference TypeJournal (article/letter/editorial)
TitleTransient thermal properties of high-power diode laser bars
JournalApplied Physics Letters
AuthorsZiegler, MathiasAuthor
Weik, FritzAuthor
Tomm, Jens W.Author
Elsaesser, ThomasAuthor
Nakwaski, WłodzimierzAuthor
Sarzała, Robert P.Author
Lorenzen, DirkAuthor
Meusel, JensAuthor
Kozłowska, AnnaAuthor
Year2006 (December 25)Volume89
Issue26
PublisherAIP Publishing
DOIdoi:10.1063/1.2424644Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8551629Long-form Identifiermindat:1:5:8551629:2
GUID0
Full ReferenceZiegler, Mathias, Weik, Fritz, Tomm, Jens W., Elsaesser, Thomas, Nakwaski, Włodzimierz, Sarzała, Robert P., Lorenzen, Dirk, Meusel, Jens, Kozłowska, Anna (2006) Transient thermal properties of high-power diode laser bars. Applied Physics Letters, 89 (26). 263506pp. doi:10.1063/1.2424644
Plain TextZiegler, Mathias, Weik, Fritz, Tomm, Jens W., Elsaesser, Thomas, Nakwaski, Włodzimierz, Sarzała, Robert P., Lorenzen, Dirk, Meusel, Jens, Kozłowska, Anna (2006) Transient thermal properties of high-power diode laser bars. Applied Physics Letters, 89 (26). 263506pp. doi:10.1063/1.2424644
In(2006, December) Applied Physics Letters Vol. 89 (26) AIP Publishing

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Ziegler, Mathias, Tomm, Jens W., Elsaesser, Thomas, Erbert, Götz, Bugge, Frank, Nakwaski, Włodzimierz, Sarzała, Robert P. (2008) Visualization of heat flows in high-power diode lasers by lock-in thermography. Applied Physics Letters, 92 (10). 103513pp. doi:10.1063/1.2898199
Kozlowska, Anna, Wawrzyniak, Piotr, Tomm, Jens W., Weik, Fritz, Elsaesser, Thomas (2005) Deep level emission from high-power diode laser bars detected by multispectral infrared imaging. Applied Physics Letters, 87 (15). 153503pp. doi:10.1063/1.2089150
LeClech, Julien, Ziegler, Mathias, Mukherjee, Jayanta, Tomm, Jens W., Elsaesser, Thomas, Landesman, Jean-Pierre, Corbett, Brian, Mclnerney, John G., Reithmaier, Johann Peter, Deubert, Stefan, Forchel, Alfred, Nakwaski, Włodzimierz, Sarzała, Robert P. (2009) Microthermography of diode lasers: The impact of light propagation on image formation. Journal of Applied Physics, 105 (1). 14502pp. doi:10.1063/1.3055356
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Tien, Tran Quoc, Weik, Fritz, Tomm, Jens W., Sumpf, Bernd, Zorn, Martin, Zeimer, Ute, Erbert, Götz (2006) Thermal properties and degradation behavior of red-emitting high-power diode lasers. Applied Physics Letters, 89 (18). 181112pp. doi:10.1063/1.2374693
Ziegler, Mathias, Tomm, Jens W., Elsaesser, Thomas, Matthiesen, Clemens, Bou Sanayeh, Marwan, Brick, Peter (2008) Real-time thermal imaging of catastrophic optical damage in red-emitting high-power diode lasers. Applied Physics Letters, 92 (10). 103514pp. doi:10.1063/1.2898202
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Kozlowska, Anna, Latoszek, Mateusz, Tomm, Jens W., Weik, Fritz, Elsaesser, Thomas, Zbroszczyk, Mariusz, Bugajski, Maciej, Spellenberg, B., Bassler, M. (2005) Analysis of thermal images from diode lasers: Temperature profiling and reliability screening. Applied Physics Letters, 86 (20). 203503pp. doi:10.1063/1.1928319
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