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Gruverman, A., Rodriguez, B. J., Dehoff, C., Waldrep, J. D., Kingon, A. I., Nemanich, R. J., Cross, J. S. (2005) Direct studies of domain switching dynamics in thin film ferroelectric capacitors. Applied Physics Letters, 87 (8). 82902pp. doi:10.1063/1.2010605

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Reference TypeJournal (article/letter/editorial)
TitleDirect studies of domain switching dynamics in thin film ferroelectric capacitors
JournalApplied Physics Letters
AuthorsGruverman, A.Author
Rodriguez, B. J.Author
Dehoff, C.Author
Waldrep, J. D.Author
Kingon, A. I.Author
Nemanich, R. J.Author
Cross, J. S.Author
Year2005 (August 22)Volume87
Issue8
PublisherAIP Publishing
DOIdoi:10.1063/1.2010605Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8546142Long-form Identifiermindat:1:5:8546142:4
GUID0
Full ReferenceGruverman, A., Rodriguez, B. J., Dehoff, C., Waldrep, J. D., Kingon, A. I., Nemanich, R. J., Cross, J. S. (2005) Direct studies of domain switching dynamics in thin film ferroelectric capacitors. Applied Physics Letters, 87 (8). 82902pp. doi:10.1063/1.2010605
Plain TextGruverman, A., Rodriguez, B. J., Dehoff, C., Waldrep, J. D., Kingon, A. I., Nemanich, R. J., Cross, J. S. (2005) Direct studies of domain switching dynamics in thin film ferroelectric capacitors. Applied Physics Letters, 87 (8). 82902pp. doi:10.1063/1.2010605
In(2005, August) Applied Physics Letters Vol. 87 (8) AIP Publishing

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Dehoff, C., Rodriguez, B. J., Kingon, A. I., Nemanich, R. J., Gruverman, A., Cross, J. S. (2005) Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors. Review of Scientific Instruments, 76 (2). 23708pp. doi:10.1063/1.1850652
Gruverman, A., Rodriguez, B. J., Kingon, A. I., Nemanich, R. J., Cross, J. S., Tsukada, M. (2003) Spatial inhomogeneity of imprint and switching behavior in ferroelectric capacitors. Applied Physics Letters, 82 (18). 3071-3073 doi:10.1063/1.1570942
Gruverman, A., Rodriguez, B. J., Kingon, A. I., Nemanich, R. J., Tagantsev, A. K., Cross, J. S., Tsukada, M. (2003) Mechanical stress effect on imprint behavior of integrated ferroelectric capacitors. Applied Physics Letters, 83 (4). 728-730 doi:10.1063/1.1593830
Rodriguez, B. J., Gruverman, A., Kingon, A. I., Nemanich, R. J., Cross, J. S. (2004) Three-dimensional high-resolution reconstruction of polarization in ferroelectric capacitors by piezoresponse force microscopy. Journal of Applied Physics, 95 (4). 1958-1962 doi:10.1063/1.1638889
Gruverman, A., Rodriguez, B. J., Nemanich, R. J., Kingon, A. I. (2002) Nanoscale observation of photoinduced domain pinning and investigation of imprint behavior in ferroelectric thin films. Journal of Applied Physics, 92 (5). 2734-2739 doi:10.1063/1.1497698
Rodriguez, B. J., Nemanich, R. J., Kingon, A., Gruverman, A., Kalinin, S. V., Terabe, K., Liu, X. Y., Kitamura, K. (2005) Domain growth kinetics in lithium niobate single crystals studied by piezoresponse force microscopy. Applied Physics Letters, 86 (1). 12906pp. doi:10.1063/1.1845594
Rodriguez, B. J., Gruverman, A., Kingon, A. I., Nemanich, R. J., Ambacher, O. (2002) Piezoresponse force microscopy for polarity imaging of GaN. Applied Physics Letters, 80 (22). 4166-4168 doi:10.1063/1.1483117
Rodriguez, B.J., Gruverman, A., Kingon, A.I., Nemanich, R.J., Cross, J.S. (2005) Investigation of the mechanism of polarization switching in ferroelectric capacitors by three- dimensional piezoresponse force microscopy. Applied Physics A, 80. 99-103 doi:10.1007/s00339-004-2925-2
Agronin, A., Molotskii, M., Rosenwaks, Y., Rosenman, G., Rodriguez, B. J., Kingon, A. I., Gruverman, A. (2006) Dynamics of ferroelectric domain growth in the field of atomic force microscope. Journal of Applied Physics, 99 (10). 104102pp. doi:10.1063/1.2197264
Im, J., Auciello, O., Krauss, A. R., Gruen, D. M., Chang, R. P. H., Kim, S. H., Kingon, A. I. (1999) Studies of hydrogen-induced degradation processes in SrBi2Ta2O9 ferroelectric film-based capacitors. Applied Physics Letters, 74 (8). 1162-1164 doi:10.1063/1.123474
Rodriguez, B. J., Yang, W.-C., Nemanich, R. J., Gruverman, A. (2005) Scanning probe investigation of surface charge and surface potential of GaN-based heterostructures. Applied Physics Letters, 86 (11). 112115pp. doi:10.1063/1.1869535
 
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