Kajihara, Koichi, Ikuta, Yoshiaki, Hirano, Masahiro, Hosono, Hideo (2002) Power dependence of defect formation in SiO2 glass by F2 laser irradiation. Applied Physics Letters, 81 (17). 3164-3166 doi:10.1063/1.1514395
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Power dependence of defect formation in SiO2 glass by F2 laser irradiation | ||
| Journal | Applied Physics Letters | ||
| Authors | Kajihara, Koichi | Author | |
| Ikuta, Yoshiaki | Author | ||
| Hirano, Masahiro | Author | ||
| Hosono, Hideo | Author | ||
| Year | 2002 (October 21) | Volume | 81 |
| Issue | 17 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.1514395Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8533360 | Long-form Identifier | mindat:1:5:8533360:8 |
| GUID | 0 | ||
| Full Reference | Kajihara, Koichi, Ikuta, Yoshiaki, Hirano, Masahiro, Hosono, Hideo (2002) Power dependence of defect formation in SiO2 glass by F2 laser irradiation. Applied Physics Letters, 81 (17). 3164-3166 doi:10.1063/1.1514395 | ||
| Plain Text | Kajihara, Koichi, Ikuta, Yoshiaki, Hirano, Masahiro, Hosono, Hideo (2002) Power dependence of defect formation in SiO2 glass by F2 laser irradiation. Applied Physics Letters, 81 (17). 3164-3166 doi:10.1063/1.1514395 | ||
| In | (2002, October) Applied Physics Letters Vol. 81 (17) AIP Publishing | ||
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