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Hyon, C. K., Choi, S. C., Hwang, S. W., Ahn, D., Kim, Yong, Kim, E. K. (1999) Direct nanometer-scale patterning by the cantilever oscillation of an atomic force microscope. Applied Physics Letters, 75 (2). 292-294 doi:10.1063/1.124351

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Reference TypeJournal (article/letter/editorial)
TitleDirect nanometer-scale patterning by the cantilever oscillation of an atomic force microscope
JournalApplied Physics Letters
AuthorsHyon, C. K.Author
Choi, S. C.Author
Hwang, S. W.Author
Ahn, D.Author
Kim, YongAuthor
Kim, E. K.Author
Year1999 (July 12)Volume75
Issue2
PublisherAIP Publishing
DOIdoi:10.1063/1.124351Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8524964Long-form Identifiermindat:1:5:8524964:6
GUID0
Full ReferenceHyon, C. K., Choi, S. C., Hwang, S. W., Ahn, D., Kim, Yong, Kim, E. K. (1999) Direct nanometer-scale patterning by the cantilever oscillation of an atomic force microscope. Applied Physics Letters, 75 (2). 292-294 doi:10.1063/1.124351
Plain TextHyon, C. K., Choi, S. C., Hwang, S. W., Ahn, D., Kim, Yong, Kim, E. K. (1999) Direct nanometer-scale patterning by the cantilever oscillation of an atomic force microscope. Applied Physics Letters, 75 (2). 292-294 doi:10.1063/1.124351
In(1999, July) Applied Physics Letters Vol. 75 (2) AIP Publishing

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Hyon, C. K., Choi, S. C., Song, S.-H., Hwang, S. W., Son, M. H., Ahn, D., Park, Y. J., Kim, E. K. (2000) Application of atomic-force-microscope direct patterning to selective positioning of InAs quantum dots on GaAs. Applied Physics Letters, 77 (16). 2607-2609 doi:10.1063/1.1318393
Hyon, Chan Kyeong, Choi, Seung Chul, Hwang, Sung Woo, Ahn, Doyeol, Kim, Yong, Kim, Eun Kyu (1999) Nano-Structure Fabrication and Manipulation by the Cantilever Oscillation of an Atomic Force Microscope. Japanese Journal of Applied Physics, 38. 7257-7259 doi:10.1143/jjap.38.7257
Jung, S. K., Hyon, C. K., Park, J. H., Hwang, S. W., Ahn, D., Son, M. H., Min, B. D., Kim, Yong, Kim, E. K. (1999) Fabrication and electrical characterization of planar resonant tunneling devices incorporating InAs self-assembled quantum dots. Applied Physics Letters, 75 (8). 1167-1169 doi:10.1063/1.124631
Jung, S. K., Hwang, S. W., Choi, B. H., Kim, S. I., Park, J. H., Kim, Yong, Kim, E. K., Min, S.-K. (1999) Direct electronic transport through an ensemble of InAs self-assembled quantum dots. Applied Physics Letters, 74 (5). 714-716 doi:10.1063/1.122996
Kim, R. H., Ahn, W. S., Han, S. H., Choi, S. K. (2007) Two-dimensional self-patterning of PbTiO3 on a Nb–SrTiO3 (001) surface using atomic force microscope lithography and hydrothermal epitaxy. Applied Physics Letters, 90 (17). 172907pp. doi:10.1063/1.2732175
Tsau, Liming, Wang, Dawen, Wang, K. L. (1994) Nanometer scale patterning of silicon (100) surfaces by an atomic force microscope operating in air. Applied Physics Letters, 64 (16). 2133-2135 doi:10.1063/1.111707
Kim, D. H., Sung, S.-K., Sim, J. S., Kim, K. R., Lee, J. D., Park, B.-G., Choi, B. H., Hwang, S. W., Ahn, D. (2001) Single-electron transistor based on a silicon-on-insulator quantum wire fabricated by a side-wall patterning method. Applied Physics Letters, 79 (23). 3812-3814 doi:10.1063/1.1421081
Kim, Kiwoong, Lee, Soonchil (2002) Self-oscillation mode induced in an atomic force microscope cantilever. Journal of Applied Physics, 91 (7). 4715-4719 doi:10.1063/1.1454225
Choi, B. H., Hwang, S. W., Kim, I. G., Shin, H. C., Kim, Yong, Kim, E. K. (1998) Fabrication and room-temperature characterization of a silicon self-assembled quantum-dot transistor. Applied Physics Letters, 73 (21). 3129-3131 doi:10.1063/1.122695
Choi, B. J., Jeong, D. S., Kim, S. K., Rohde, C., Choi, S., Oh, J. H., Kim, H. J., Hwang, C. S., Szot, K., Waser, R., Reichenberg, B., Tiedke, S. (2005) Resistive switching mechanism of TiO2 thin films grown by atomic-layer deposition. Journal of Applied Physics, 98 (3). 33715pp. doi:10.1063/1.2001146
Schwarz, K., Rabe, U., Hirsekorn, S., Arnold, W. (2008) Excitation of atomic force microscope cantilever vibrations by a Schottky barrier. Applied Physics Letters, 92 (18). 183105pp. doi:10.1063/1.2911916
 
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