Budzynski, P., Sielanko, J., Surowiec, Z. (2008) Properties and phase transition of (Ti,Al)N thin films prepared by ion beam-assisted deposition. Intermetallics, 16 (8). 987-994 doi:10.1016/j.intermet.2008.04.017

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Reference Type	Journal (article/letter/editorial)
Title	Properties and phase transition of (Ti,Al)N thin films prepared by ion beam-assisted deposition
Journal	Intermetallics
Authors	Budzynski, P.		Author
	Sielanko, J.		Author
	Surowiec, Z.		Author
Year	2008 (August)	Volume	16
Issue	8
Publisher	Elsevier BV
DOI	doi:10.1016/j.intermet.2008.04.017Search in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	7966070	Long-form Identifier	mindat:1:5:7966070:5
GUID	0
Full Reference	Budzynski, P., Sielanko, J., Surowiec, Z. (2008) Properties and phase transition of (Ti,Al)N thin films prepared by ion beam-assisted deposition. Intermetallics, 16 (8). 987-994 doi:10.1016/j.intermet.2008.04.017
Plain Text	Budzynski, P., Sielanko, J., Surowiec, Z. (2008) Properties and phase transition of (Ti,Al)N thin films prepared by ion beam-assisted deposition. Intermetallics, 16 (8). 987-994 doi:10.1016/j.intermet.2008.04.017
In	(2008, August) Intermetallics Vol. 16 (8) Elsevier BV

	*Noro, J., Ramos, A.S., Vieira, M.T. (2008) Intermetallic phase formation in nanometric Ni/Al multilayer thin films. Intermetallics, 16 (9). 1061-1065 doi:10.1016/j.intermet.2008.06.002*
	Meng, Lijian, Gao, Jinsong, Teixeira, V., dos Santos, M. P. (2008) Indium tin oxide thin films prepared by ion beam assisted deposition technique at different ion beam currents. physica status solidi (a), 205 (8). 1961-1966 doi:10.1002/pssa.200778852
	*(2013) Properties of Ta2O5 thin films prepared by ion-assisted deposition. Materials Research Bulletin, 48 (10) 4206-4209 doi:10.1016/j.materresbull.2013.06.068*
	*Netterfield, Roger P., Sainty, W. G., Martin, P. J., Sie, S. H. (1985) Properties of CeO_2 thin films prepared by oxygen-ion-assisted deposition. Applied Optics, 24. 2267pp. doi:10.1364/ao.24.002267*
	He, Yue, Zhang, Jizhong, Yao, Wenqing, Li, Dexing, Teng, Xu (2009) Effect of temperature on residual stress and mechanical properties of Ti films prepared by both ion implantation and ion beam assisted deposition. Applied Surface Science, 255. 4484-4490 doi:10.1016/j.apsusc.2008.11.053
	*Popovič, J., Brož, P., Buršík, J. (2008) Microstructure and phase equilibria in the Ni–Al–W system. Intermetallics, 16 (7). 884-888 doi:10.1016/j.intermet.2008.04.003*
	Leng, Jian, Yu, Zhinong, Li, Yuqiong, Zhang, Dongpu, Liao, Xiaoyi, Xue, Wei (2010) Optical and electrical properties of Y2O3 thin films prepared by ion beam assisted deposition. Applied Surface Science, 256. 5832-5836 doi:10.1016/j.apsusc.2010.03.054
	Vijai Bharathy, P., Yang, Q., Nataraj, D. (2014) Microstructure and Adhesion Properties of a-CN and Ti/a-CN Nanocomposite Thin Films Prepared by Hybrid Ion Beam Deposition Technique. Advanced Materials Research, 938. 36-39 doi:10.4028/www.scientific.net/amr.938.36
	Mansilla, Catalina (2009) Structure, microstructure and optical properties of cerium oxide thin films prepared by electron beam evaporation assisted with ion beams. Solid State Sciences, 11 (8) 1456-1464 doi:10.1016/j.solidstatesciences.2009.05.001
	*Cui, C.Y., Gu, Y.F., Ping, D.H., Harada, H. (2008) Phase constituents in Ni–Al–Co–Ti quaternary alloys. Intermetallics, 16 (7). 910-916 doi:10.1016/j.intermet.2008.04.006*
	*Peng, D.L., Jiang, S.R., Zhao, X.Y., Cheng, G.H. (1994) Study of ternary (Ti, Al) N thin films prepared by ion beam mixing. Materials Letters, 20. 179-182 doi:10.1016/0167-577x(94)90084-1*

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Budzynski, P., Sielanko, J., Surowiec, Z. (2008) Properties and phase transition of (Ti,Al)N thin films prepared by ion beam-assisted deposition. Intermetallics, 16 (8). 987-994 doi:10.1016/j.intermet.2008.04.017

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