Kim, Jong-Woong, Kim, Dae-Gon, Koo, Ja-Myeong, Yoon, Jeong-Won, Choi, Sunglak, Kim, Kyung-Sik, Nam, Jae-Do, Lee, Hoo-Jeong, Joo, Jinho, Jung, Seung-Boo (2007) Characterization of Failure Behaviors in Anisotropic Conductive Interconnection. MATERIALS TRANSACTIONS, 48 (5). 1070-1078 doi:10.2320/matertrans.48.1070
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Characterization of Failure Behaviors in Anisotropic Conductive Interconnection | ||
| Journal | MATERIALS TRANSACTIONS | ||
| Authors | Kim, Jong-Woong | Author | |
| Kim, Dae-Gon | Author | ||
| Koo, Ja-Myeong | Author | ||
| Yoon, Jeong-Won | Author | ||
| Choi, Sunglak | Author | ||
| Kim, Kyung-Sik | Author | ||
| Nam, Jae-Do | Author | ||
| Lee, Hoo-Jeong | Author | ||
| Joo, Jinho | Author | ||
| Jung, Seung-Boo | Author | ||
| Year | 2007 | Volume | 48 |
| Issue | 5 | ||
| Publisher | Japan Institute of Metals | ||
| DOI | doi:10.2320/matertrans.48.1070Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 7779137 | Long-form Identifier | mindat:1:5:7779137:5 |
| GUID | 0 | ||
| Full Reference | Kim, Jong-Woong, Kim, Dae-Gon, Koo, Ja-Myeong, Yoon, Jeong-Won, Choi, Sunglak, Kim, Kyung-Sik, Nam, Jae-Do, Lee, Hoo-Jeong, Joo, Jinho, Jung, Seung-Boo (2007) Characterization of Failure Behaviors in Anisotropic Conductive Interconnection. MATERIALS TRANSACTIONS, 48 (5). 1070-1078 doi:10.2320/matertrans.48.1070 | ||
| Plain Text | Kim, Jong-Woong, Kim, Dae-Gon, Koo, Ja-Myeong, Yoon, Jeong-Won, Choi, Sunglak, Kim, Kyung-Sik, Nam, Jae-Do, Lee, Hoo-Jeong, Joo, Jinho, Jung, Seung-Boo (2007) Characterization of Failure Behaviors in Anisotropic Conductive Interconnection. MATERIALS TRANSACTIONS, 48 (5). 1070-1078 doi:10.2320/matertrans.48.1070 | ||
| In | (2007) MATERIALS TRANSACTIONS Vol. 48 (5) Japan Institute of Metals | ||
See Also
These are possibly similar items as determined by title/reference text matching only.
