| Reference Type | Journal (article/letter/editorial) |
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| Title | A guided Bayesian inference approach for detection of multiple flaws in structures using the extended finite element method |
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| Journal | Computers & Structures |
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| Authors | Yan, Gang | Author |
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| Sun, Hao | Author |
| Waisman, Haim | Author |
| Year | 2015 (May) | Volume | 152 |
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| Publisher | Elsevier BV |
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| DOI | doi:10.1016/j.compstruc.2015.02.010Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 6589770 | Long-form Identifier | mindat:1:5:6589770:0 |
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| GUID | 0 |
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| Full Reference | Yan, Gang, Sun, Hao, Waisman, Haim (2015) A guided Bayesian inference approach for detection of multiple flaws in structures using the extended finite element method. Computers & Structures, 152. 27-44 doi:10.1016/j.compstruc.2015.02.010 |
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| Plain Text | Yan, Gang, Sun, Hao, Waisman, Haim (2015) A guided Bayesian inference approach for detection of multiple flaws in structures using the extended finite element method. Computers & Structures, 152. 27-44 doi:10.1016/j.compstruc.2015.02.010 |
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| In | (n.d.) Computers & Structures Vol. 152. Elsevier BV |
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