Jensen, I. J. T., Diplas, S., Løvvik, O. M., Watts, J., Hinder, S., Schreuders, H., Dam, B. (2010) X-ray photoelectron spectroscopy study of MgH2 thin films grown by reactive sputtering. Surface and Interface Analysis, 42 (6). 1140-1143 doi:10.1002/sia.3347
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | X-ray photoelectron spectroscopy study of MgH2 thin films grown by reactive sputtering | ||
| Journal | Surface and Interface Analysis | ||
| Authors | Jensen, I. J. T. | Author | |
| Diplas, S. | Author | ||
| Løvvik, O. M. | Author | ||
| Watts, J. | Author | ||
| Hinder, S. | Author | ||
| Schreuders, H. | Author | ||
| Dam, B. | Author | ||
| Year | 2010 (May 14) | Volume | 42 |
| Issue | 6 | ||
| Publisher | Wiley | ||
| DOI | doi:10.1002/sia.3347Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 6512458 | Long-form Identifier | mindat:1:5:6512458:9 |
| GUID | 0 | ||
| Full Reference | Jensen, I. J. T., Diplas, S., Løvvik, O. M., Watts, J., Hinder, S., Schreuders, H., Dam, B. (2010) X-ray photoelectron spectroscopy study of MgH2 thin films grown by reactive sputtering. Surface and Interface Analysis, 42 (6). 1140-1143 doi:10.1002/sia.3347 | ||
| Plain Text | Jensen, I. J. T., Diplas, S., Løvvik, O. M., Watts, J., Hinder, S., Schreuders, H., Dam, B. (2010) X-ray photoelectron spectroscopy study of MgH2 thin films grown by reactive sputtering. Surface and Interface Analysis, 42 (6). 1140-1143 doi:10.1002/sia.3347 | ||
| In | (2010, May) Surface and Interface Analysis Vol. 42 (6) Wiley | ||
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