(1995, March) Surface and Interface Analysis Vol. 23 (3) Wiley

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Reference Type	Journal (issue)
Journal	Surface and Interface Analysis
Year	1995 (March)	Volume	23
Issue	< 3 >
Publisher	Wiley
Mindat Ref. ID	6505116	Long-form Identifier	mindat:1:5:6505116:8
GUID	0
Full Reference	(1995, March) Surface and Interface Analysis Vol. 23 (3) Wiley
Plain Text	(1995, March) Surface and Interface Analysis Vol. 23 (3) Wiley
In	(n.d.) Surface and Interface Analysis Vol. 23. Wiley

Contains

	*(1995) Masthead. Surface and Interface Analysis, 23 (3). doi:10.1002/sia.740230301*
	*(1995) Surface and Interface Analysis, 23 (3). Wiley. doi:10.1002/sia.v23:3*
	Powell, C. J. (1995) Energy calibration of x-ray photoelectron spectrometers: Results of an interlaboratory comparison to evaluate a proposed calibration procedure. Surface and Interface Analysis, 23 (3). 121-132 doi:10.1002/sia.740230302
	*Hallam, K. R., Wild, R. K. (1995) XPS analysis of metal grain boundary surfaces. Surface and Interface Analysis, 23 (3). 133-136 doi:10.1002/sia.740230303*
	Ermolieff, A., Charrasin, V., Marthon, S., Piaguet, J., Deleonibus, S. (1995) Experimental requirements for surface charge spectroscopy (SCS) measurements. Examples of SCS measurements on high- and low-resistivity Si samples. Surface and Interface Analysis, 23 (3). 137-147 doi:10.1002/sia.740230304
	Wulff, H., Klimke, J., Gerova, E. (1995) Characterization of MgO layers on different alumina and glass substrates by grazing incidence diffractometry and grazing incidence X-ray reflectometry. Surface and Interface Analysis, 23 (3). 148-154 doi:10.1002/sia.740230305
	Holtkamp, D., Elschner, A., Müller, G., Pieroth, M. (1995) Novel model system to study the influence of rubber compound formulation on the structure and composition of the rubber-brass interphase. Surface and Interface Analysis, 23 (3). 155-162 doi:10.1002/sia.740230306
	van der Heide, P. A. W., Ramamuthy, S., McIntyre, N. S. (1995) Application of the infinite velocity method for quantifying negative secondary ion emissions to multi-layered samples. Surface and Interface Analysis, 23 (3). 163-170 doi:10.1002/sia.740230307
	Galtayries, A., Bonnelle, J.-P. (1995) XPS and ISS studies on the interaction of H2S with polycrystalline Cu, Cu2O and CuO surfaces. Surface and Interface Analysis, 23 (3). 171-179 doi:10.1002/sia.740230308
	Zagorenko, A., Beccat, P., Huiban, Y., Lynch, J. (1995) Accuracy of the correction for a hydrocarbon contamination layer in routine quantitative XPS analysis of oxygen-inert samples. Surface and Interface Analysis, 23 (3). 180-184 doi:10.1002/sia.740230309
	Zaporozchenko, V. I., Stepanova, M. G., Vojtusik, S. S. (1995) Effect of ion incidence angle on surface concentrations in Ar+-bombarded Co2Si, studied by AES. Surface and Interface Analysis, 23 (3). 185-187 doi:10.1002/sia.740230310

	*(1995, January) Surface and Interface Analysis* Vol. 23 (1) Wiley**
	*(1995, September) Surface and Interface Analysis* Vol. 23 (10) Wiley**
	*(1995, October) Surface and Interface Analysis* Vol. 23 (11) Wiley**
	*(1995, November) Surface and Interface Analysis* Vol. 23 (12) Wiley**
	*(1995, December) Surface and Interface Analysis* Vol. 23 (13) Wiley**
	*(1995, February) Surface and Interface Analysis* Vol. 23 (2) Wiley**
	*(1995, April) Surface and Interface Analysis* Vol. 23 (4) Wiley**
	*(1995, May) Surface and Interface Analysis* Vol. 23 (5) Wiley**
	*(1995, June) Surface and Interface Analysis* Vol. 23 (6) Wiley**
	*(1995, July) Surface and Interface Analysis* Vol. 23 (7) Wiley**
	*(1995, August) Surface and Interface Analysis* Vol. 23 (9) Wiley**

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(1995, March) Surface and Interface Analysis Vol. 23 (3) Wiley

Contains

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