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Mitchell, D. F., Sproule, G. I., Graham, M. J. (1990) Sputter reduction of oxides by ion bombardment during Auger depth profile analysis. Surface and Interface Analysis, 15 (8). 487-497 doi:10.1002/sia.740150808

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Reference TypeJournal (article/letter/editorial)
TitleSputter reduction of oxides by ion bombardment during Auger depth profile analysis
JournalSurface and Interface Analysis
AuthorsMitchell, D. F.Author
Sproule, G. I.Author
Graham, M. J.Author
Year1990 (August)Volume15
Issue8
PublisherWiley
DOIdoi:10.1002/sia.740150808Search in ResearchGate
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Mindat Ref. ID6502652Long-form Identifiermindat:1:5:6502652:4
GUID0
Full ReferenceMitchell, D. F., Sproule, G. I., Graham, M. J. (1990) Sputter reduction of oxides by ion bombardment during Auger depth profile analysis. Surface and Interface Analysis, 15 (8). 487-497 doi:10.1002/sia.740150808
Plain TextMitchell, D. F., Sproule, G. I., Graham, M. J. (1990) Sputter reduction of oxides by ion bombardment during Auger depth profile analysis. Surface and Interface Analysis, 15 (8). 487-497 doi:10.1002/sia.740150808
In(1990, August) Surface and Interface Analysis Vol. 15 (8) Wiley

See Also

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Mitchell, D. F., Arlow, J. S., Phillips, J. R., Sproule, G. I. (1989) Optimized ion beam raster for SIMS sputter depth profiling. Surface and Interface Analysis, 14 (6). 302-306 doi:10.1002/sia.740140606
Peinador, J. A., Abril, I., Jiménez-Rodríguez, J. J., Gras-Marti, A. (1990) Sputter depth profile analysis of marker layers. Surface and Interface Analysis, 15 (8). 463-465 doi:10.1002/sia.740150804
Jansson, C., Morgen, P. (1990) Factor analysis of d(NE)/dE Auger electron spectra of AuCu alloys: Surface composition during Ar+ ion bombardment and oxidation. Surface and Interface Analysis, 15 (1). 1-6 doi:10.1002/sia.740150102
Hill, Malcolm D. (1988) Automated interface recognition in auger sputter depth profiling. Surface and Interface Analysis, 12 (1). 21-26 doi:10.1002/sia.740120107
Makh, S. S., Smith, R., Walls, J. M. (1980) The development of surface shape during sputter-depth profiling in Auger electron spectroscopy. Surface and Interface Analysis, 2 (3). 115-119 doi:10.1002/sia.740020307
Mitchell, D. F., Graham, M. J. (1987) Comparison of Auger and SIMS analysis of a thin passive oxide film on iron—25% chromium. Surface and Interface Analysis, 10 (5). 259-261 doi:10.1002/sia.740100507
Carter, G., Nobes, M. J., Katardjiev, I. V. (1990) The effect of atomic-scale etch pit formation on depth resolution in sputter profiling. Surface and Interface Analysis, 15 (7). 447-450 doi:10.1002/sia.740150709
Pakes, A., Skeldon, P., Thompson, G. E., Hussey, R. J., Moisa, S., Sproule, G. I., Landheer, D., Graham, M. J. (2002) Composition and growth of anodic and thermal oxides on InP and GaAs. Surface and Interface Analysis, 34 (1). 481-484 doi:10.1002/sia.1343
Lam, N. Q. (1988) Ion bombardment effects on the near-surface composition during sputter profiling. Surface and Interface Analysis, 12 (2). 65-77 doi:10.1002/sia.740120202
Konarski, P., Kaczorek, K., Kaliński, D., Chmielewski, M., Pietrzak, K., Barlak, M. (2013) Ion implanted inconel alloy - SIMS and GDMS depth profile analysis. Surface and Interface Analysis, 45 (1). 494-497 doi:10.1002/sia.5154
Skinner, D. K., Swanson, J. G., Haynes, C. V. (1983) Ion beam induced composition changes during auger sputter profiling of thin Al films on InP. Surface and Interface Analysis, 5 (1). 38-42 doi:10.1002/sia.740050109
 
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