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Sykes, D. E. (1990) Handbook of static secondary ion mass spectrometry (SIMS), D. Briggs, A. Brown and J. C. Vickerman (EDS), ISBN 0471 916277. Price: £125.00, US$258.75. No. of pages: 164 Wiley, Chichester, 1989. Surface and Interface Analysis, 15 (3). 231 doi:10.1002/sia.740150308

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Reference TypeJournal (article/letter/editorial)
TitleHandbook of static secondary ion mass spectrometry (SIMS), D. Briggs, A. Brown and J. C. Vickerman (EDS), ISBN 0471 916277. Price: £125.00, US$258.75. No. of pages: 164 Wiley, Chichester, 1989.
JournalSurface and Interface Analysis
AuthorsSykes, D. E.Author
Year1990 (March)Volume15
Issue3
PublisherWiley
DOIdoi:10.1002/sia.740150308Search in ResearchGate
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Mindat Ref. ID6502525Long-form Identifiermindat:1:5:6502525:1
GUID0
Full ReferenceSykes, D. E. (1990) Handbook of static secondary ion mass spectrometry (SIMS), D. Briggs, A. Brown and J. C. Vickerman (EDS), ISBN 0471 916277. Price: £125.00, US$258.75. No. of pages: 164 Wiley, Chichester, 1989. Surface and Interface Analysis, 15 (3). 231 doi:10.1002/sia.740150308
Plain TextSykes, D. E. (1990) Handbook of static secondary ion mass spectrometry (SIMS), D. Briggs, A. Brown and J. C. Vickerman (EDS), ISBN 0471 916277. Price: £125.00, US$258.75. No. of pages: 164 Wiley, Chichester, 1989. Surface and Interface Analysis, 15 (3). 231 doi:10.1002/sia.740150308
In(1990, March) Surface and Interface Analysis Vol. 15 (3) Wiley

See Also

These are possibly similar items as determined by title/reference text matching only.

Briggs, D. (1989) Secondary Ion Mass Spectrometry, SIMS VI. A. Benninghoven, A. M. Huber and H. W. Werner (Eds). Wiley, Chichester, 1988. 1106 pages. Price: £75.00. ISBN 0471 9183 6. Surface and Interface Analysis, 14 (4). 213 doi:10.1002/sia.740140409
Le Beyec, Y. (1990) Handbook of static secondary ion mass spectrometry (SIMS). By D. Briggs, A. Brown And J. C. Vickerman John Wiley, 1989, pp 156, £125.00. Rapid Communications in Mass Spectrometry, 4 (3). 97 doi:10.1002/rcm.1290040310
Short, R. D. (1993) Secondary ion mass spectrometry, SIMS VIII. A. Benninghoven, K. T. F. Janssen, J. Tumpner and H. W. Werner (Eds.). No of pages: 944. ISBN 0471 930644. Price: £115.00. Wiley, Chichester (1992). Surface and Interface Analysis, 20 (4). 326-327 doi:10.1002/sia.740200411
Briggs, D. (1991) Secondary Ion Mass Spectrometry: Principles & Applications Price: £45.00. No. of pages xii + 341. Oxford Science Publications, Oxford 1989. Surface and Interface Analysis, 17 (3). 168 doi:10.1002/sia.740170309
Leggett, G. J., Vickerman, J. C., Briggs, D. (1990) Applications of tandem quadrupole mass spectrometry in SIMS. Surface and Interface Analysis, 16 (1). 3-8 doi:10.1002/sia.740160104
van den Berg, Jaap (1993) D. Briggs and M. Seah (Eds). Practical surface analysis. Volume 2. Ion and Neutral Spectroscopy Wiley, Chichester (1993) Price: £99. No. of pages: 756. ISBN: 471920827. Surface and Interface Analysis, 20 (13). 1081-1082 doi:10.1002/sia.740201309
Stewart, Alan (1989) An Introduction to Zeolite Molecular Sieves by Alan Dyer. Wiley, Chichester, 1988. 164 pages. Price: £29.50. ISBN 0471 91981 0. Surface and Interface Analysis, 14 (4). 213 doi:10.1002/sia.740140410
Briggs, David, Brown, Alan, Vickerman, J.C., Adams, F. (1990) Handbook of static secondary ion mass spectrometry (SIMS). Analytica Chimica Acta, 236. 509-510 doi:10.1016/s0003-2670(00)83361-9
Brewis, D. M. (1988) Polymer surfaces and interfaces, Wiley, Chichester, 1987, 272 pages, £31.50/$67.50, ISBN 0471 91214 X. W. J. Feast and H. S. Munro (Eds). Surface and Interface Analysis, 11 (4). 217 doi:10.1002/sia.740110407
Richmond, C. J. (1987) Ion implantation. H. Ryssel and I. Ruge. Wiley, Chichester, 1986, 478 pages, £48, ISBN 0471-10311 X. Surface and Interface Analysis, 10 (4). 221 doi:10.1002/sia.740100409
Brown, A., Vickerman, J. C. (1984) Static SIMS for applied surface analysis. Surface and Interface Analysis, 6 (1). 1-14 doi:10.1002/sia.740060102
 
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