(1988, October) Surface and Interface Analysis Vol. 13 (1) Wiley

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Reference Type	Journal (issue)
Journal	Surface and Interface Analysis
Year	1988 (October)	Volume	13
Issue	1 >
Publisher	Wiley
Mindat Ref. ID	6501922	Long-form Identifier	mindat:1:5:6501922:3
GUID	0
Full Reference	(1988, October) Surface and Interface Analysis Vol. 13 (1) Wiley
Plain Text	(1988, October) Surface and Interface Analysis Vol. 13 (1) Wiley
In	(n.d.) Surface and Interface Analysis Vol. 13. Wiley

Contains

	*(1988) Masthead. Surface and Interface Analysis, 13 (1). doi:10.1002/sia.740130101*
	*Briggs, D. (1988) Editorial. Surface and Interface Analysis, 13 (1). 1 doi:10.1002/sia.740130102*
	*Brox, B., Olefjord, I. (1988) ESCA Studies of MoO2 and MoO3. Surface and Interface Analysis, 13 (1). 3-6 doi:10.1002/sia.740130103*
	*Sekine, Tetsu, Sato, Tomoshige, Nagasawa, Yuji, Sakai, Yuji (1988) Topographic compensation in Auger electron spectroscopy. Surface and Interface Analysis, 13 (1). 7-13 doi:10.1002/sia.740130104*
	Darque-Ceretti, E., Delamare, F., Blaise, G. (1988) Secondary ion emission of α-brass alloys. The chemical effect on the ionization yield of copper and zinc. Surface and Interface Analysis, 13 (1). 14-19 doi:10.1002/sia.740130105
	Willich, P., Obertop, D. (1988) Composition and thickness of submicron metal coatings and multilayers on Si determined by EPMA. Surface and Interface Analysis, 13 (1). 20-24 doi:10.1002/sia.740130106
	Fierro, J. L. G., Palacios, J. M., Tomas, F. (1988) An analytical SEM and XPS study of platinum-rhodium gauzes used in high pressure ammonia burners. Surface and Interface Analysis, 13 (1). 25-32 doi:10.1002/sia.740130107
	Hoflund, Gar B., Corallo, Gregory R. (1988) A technique for performing angle-resolved electron energy loss spectroscopy: A study of polycrystalline tin. Surface and Interface Analysis, 13 (1). 33-36 doi:10.1002/sia.740130108
	Pivin, J. C. (1988) Complementary data of RBS, NRA and SIMS on diffusion processes during friction in nitride implantation films. Surface and Interface Analysis, 13 (1). 37-45 doi:10.1002/sia.740130109
	Grant, J. T., Williams, P., Fine, J., Powell, C. J. (1988) The status of reference data, reference materials and reference procedures in surface analysis. Surface and Interface Analysis, 13 (1). 46-50 doi:10.1002/sia.740130110
	Hill, I. R., Lau, W. M., North, R. A. (1988) Implantation of29Si into GaAs {100}: Surface analysis and modelling of the dopant distribution. Surface and Interface Analysis, 13 (1). 51-54 doi:10.1002/sia.740130111
	*Pamler, W. (1988) Problems of quantitative Auger analysis of TiNx thin films: Peak overlapping and line shape changes. Surface and Interface Analysis, 13 (1). 55-60 doi:10.1002/sia.740130112*

	*(1988, November) Surface and Interface Analysis* Vol. 13 (2) Wiley**
	*(1988, December) Surface and Interface Analysis* Vol. 13 (4) Wiley**
	*(1979, October) Surface and Interface Analysis* Vol. 1 (5) Wiley**
	*(1988, January) Surface and Interface Analysis* Vol. 11 (1) Wiley**
	*(1988, July) Surface and Interface Analysis* Vol. 12 (1) Wiley**
	*(1980, October) Surface and Interface Analysis* Vol. 2 (5) Wiley**
	*(1981, October) Surface and Interface Analysis* Vol. 3 (5) Wiley**
	*(1982, October) Surface and Interface Analysis* Vol. 4 (5) Wiley**
	*(1983, October) Surface and Interface Analysis* Vol. 5 (5) Wiley**
	*(1984, October) Surface and Interface Analysis* Vol. 6 (5) Wiley**
	*(1985, October) Surface and Interface Analysis* Vol. 7 (5) Wiley**

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(1988, October) Surface and Interface Analysis Vol. 13 (1) Wiley

Contains

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