(1988, July) Surface and Interface Analysis Vol. 12 (5) Wiley

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Reference Type	Journal (issue)
Journal	Surface and Interface Analysis
Year	1988 (July)	Volume	12
Issue	< 5 >
Publisher	Wiley
Mindat Ref. ID	6501784	Long-form Identifier	mindat:1:5:6501784:5
GUID	0
Full Reference	(1988, July) Surface and Interface Analysis Vol. 12 (5) Wiley
Plain Text	(1988, July) Surface and Interface Analysis Vol. 12 (5) Wiley
In	(n.d.) Surface and Interface Analysis Vol. 12. Wiley

Contains

	*(1988) Masthead. Surface and Interface Analysis, 12 (5). doi:10.1002/sia.740120501*
	Ploog, Klaus (1988) Molecular beam epitaxy of semiconductor interfaces and quantum wells for advanced optoelectronic devices. Surface and Interface Analysis, 12 (5). 279-287 doi:10.1002/sia.740120502
	*Occhiello, E., Garbassi, F. (1988) XPS and AES studies of halofluorocarbon plasma etched surfaces. Surface and Interface Analysis, 12 (5). 288-292 doi:10.1002/sia.740120503*
	Jaegermann, W., Ohuchi, F. S., Parkinson, B. A. (1988) The interaction of group IB metals with van der waals faces of semiconducting metal dichalcogenides. Surface and Interface Analysis, 12 (5). 293-296 doi:10.1002/sia.740120504
	Corallo, Cheryl F., Hoflund, Gar B. (1988) An energy-resolved, electron-stimulated desorption study of hydrogen from cleaned and oxidized Si(100). Surface and Interface Analysis, 12 (5). 297-302 doi:10.1002/sia.740120505
	*Webb, A. P., Smith, J. A. (1988) Applications ofin situ SIMS during processing of electronic materials. Surface and Interface Analysis, 12 (5). 303-308 doi:10.1002/sia.740120506*
	*Finster, J. (1988) SiO2 in 6:3 (stishovite) and 4:2 Co-ordination—Characterization by core level spectroscopy (XPS/XAES). Surface and Interface Analysis, 12 (5). 309-314 doi:10.1002/sia.740120507*
	*Hofmann, A., Streubel, P., Meisel, A. (1988) XPS investigation of oxide films on InP(100). Surface and Interface Analysis, 12 (5). 315-319 doi:10.1002/sia.740120508*
	Sodhi, R. N. S., Lau, W. M., Ingrey, S. I. J. (1988) Core-Level binding energy shifts on inp surfaces induced by sputtering and annealing. Surface and Interface Analysis, 12 (5). 321-322 doi:10.1002/sia.740120509
	*Ebel, M. F., Ebel, H., Buchner, H., Chabicovsky, R. (1988) Thin Si3N4 films on Si wafers. Surface and Interface Analysis, 12 (5). 322-323 doi:10.1002/sia.740120510*
	Ingo, G. M., Zacchetti, N., Della Sala, D., Coluzza, C. (1988) XPS investigation on amorphous silion nitride (a-SiNx) chemical structure. Surface and Interface Analysis, 12 (5). 323-324 doi:10.1002/sia.740120511
	*Zeininger, H., v. Criegern, R., Röhl, S. (1988) SIMS analysis of the 4 megabit DRAM trench wall. Surface and Interface Analysis, 12 (5). 324-325 doi:10.1002/sia.740120512*
	Lahtinen, J., Vehanen, A., Punkka, E., Hautojärvi, P., Keinonen, J., Hautala, M., Rauhala, E., Karttunen, V., Kuronen, A., Räisänen, J. (1988) Damage production in hydrogen-implanted silicon. Surface and Interface Analysis, 12 (5). 325-326 doi:10.1002/sia.740120513
	Steiner, P., Hüfner, S., Kinsinger, V., Sander, I., Siegwart, B., Schmitt, H., Schulz, R., Junk, S., Schwitzgebel, G., Gold, A., Politis, C., Müller, H. P., Hoppe, R., Kemmler-Sack, S., Kunz, C. (1988) The hole concentration on oxygen sites in teh high Tc superconductor YBa2Cu3O7-x. Surface and Interface Analysis, 12 (5). 326 doi:10.1002/sia.740120514

	*(1988, July) Surface and Interface Analysis* Vol. 12 (12) Wiley**
	*(1988, July) Surface and Interface Analysis* Vol. 12 (1) Wiley**
	*(1988, July) Surface and Interface Analysis* Vol. 12 (10) Wiley**
	*(1988, July) Surface and Interface Analysis* Vol. 12 (11) Wiley**
	*(1988, July) Surface and Interface Analysis* Vol. 12 (2) Wiley**
	*(1988, July) Surface and Interface Analysis* Vol. 12 (3) Wiley**
	*(1988, July) Surface and Interface Analysis* Vol. 12 (4) Wiley**
	*(1988, July) Surface and Interface Analysis* Vol. 12 (6) Wiley**
	*(1988, July) Surface and Interface Analysis* Vol. 12 (7) Wiley**
	*(1988, July) Surface and Interface Analysis* Vol. 12 (8) Wiley**
	*(1988, July) Surface and Interface Analysis* Vol. 12 (9) Wiley**

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(1988, July) Surface and Interface Analysis Vol. 12 (5) Wiley

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