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Moulin, G., Severac, C., Huntz, A. M. (1986) Application of XPS analysis to high temperature corrosion phenomena. Surface and Interface Analysis, 9 (6). 388 doi:10.1002/sia.740090611

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Reference TypeJournal (article/letter/editorial)
TitleApplication of XPS analysis to high temperature corrosion phenomena
JournalSurface and Interface Analysis
AuthorsMoulin, G.Author
Severac, C.Author
Huntz, A. M.Author
Year1986 (July)Volume9
Issue6
PublisherWiley
DOIdoi:10.1002/sia.740090611Search in ResearchGate
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Mindat Ref. ID6501112Long-form Identifiermindat:1:5:6501112:4
GUID0
Full ReferenceMoulin, G., Severac, C., Huntz, A. M. (1986) Application of XPS analysis to high temperature corrosion phenomena. Surface and Interface Analysis, 9 (6). 388 doi:10.1002/sia.740090611
Plain TextMoulin, G., Severac, C., Huntz, A. M. (1986) Application of XPS analysis to high temperature corrosion phenomena. Surface and Interface Analysis, 9 (6). 388 doi:10.1002/sia.740090611
In(1986, July) Surface and Interface Analysis Vol. 9 (6) Wiley

See Also

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Amory, D. E., Genet, M. J., Rouxhet, P. G. (1988) Application of XPS to the surface analysis of yeast cells. Surface and Interface Analysis, 11 (9). 478-486 doi:10.1002/sia.740110904
Baker, A. T., Bennett, M. J., Brown, A., Lees, D. G., Meadowcroft, D. B. (1986) The use of SIMS with a microfocused ion beam to study thick corrosion scales. Surface and Interface Analysis, 9 (6). 388 doi:10.1002/sia.740090612
Garbassi, Fabio, Carli, Fabio (1986) Application of XPS to the characterization of polymer-loaded drugs. Surface and Interface Analysis, 8 (6). 229-233 doi:10.1002/sia.740080602
Akimov, A. G., Demin, V. Yu. (1986) XPS study of thin oxide films formation on iron alloys. Surface and Interface Analysis, 9 (6). 385 doi:10.1002/sia.740090609
Seah, M. P. (1986) Data compilations: their use to improve measurement certainty in surface analysis by aes and xps. Surface and Interface Analysis, 9 (2). 85-98 doi:10.1002/sia.740090203
Barker, Marten G., Schreinlechner, Inge E. (1986) Application of GDOS (glow discharge optical spectroscopy) and SIMS to the analysis of surface corrosion products on stainless steel after exposure to liquid alkali metals. Surface and Interface Analysis, 9 (6). 371-375 doi:10.1002/sia.740090605
Cimino, A., Gazzoli, D., Inversi, M., Valigi, M. (1986) XPS study of rhenium on silica. Surface and Interface Analysis, 9 (4). 245 doi:10.1002/sia.740090409
Battistoni, C., Gastaldi, L., Mattogno, G., Viticoli, S. (1986) An XPS study of layered AB2×4 semiconductors. Surface and Interface Analysis, 9 (5). 342 doi:10.1002/sia.740090531
Moretti, G., Lo Jacono, M., Fierro, G., Minelli, G. (1986) Surface characterization of CuO-ZnO-Al2O3 methanol-synthesis catalysts by XPS. Surface and Interface Analysis, 9 (4). 246 doi:10.1002/sia.740090410
Koening, M. F., Grant, J. T. (1988) Instrumental effects in the analysis of non-homogeneous specimens in XPS. Surface and Interface Analysis, 11 (6). 383-388 doi:10.1002/sia.740110619
Koenig, M. F., Grant, J. T. (1986) Monochromator versus deconvolution in xps: signal-to-noise considerations. Surface and Interface Analysis, 9 (2). 132 doi:10.1002/sia.740090212
 
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