Günes, Mehmet, Cansever, Hamza, Yilmaz, Gökhan, Smirnov, Vladimir, Finger, Friedhelm, Brüggemann, Rudolf (2012) Metastability effects in hydrogenated microcrystalline silicon thin films investigated by the dual beam photoconductivity method. Journal of Non-Crystalline Solids, 358 (17) 2074-2077 doi:10.1016/j.jnoncrysol.2012.01.063

See Also

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	Günes, Mehmet, Cansever, Hamza, Yilmaz, Gökhan, Sagban, Muzaffer H., Smirnov, Vladimir, Finger, Friedhelm, Brüggemann, Rudolf (2014) Investigation of meta- and in-stability effects in hydrogenated microcrystalline silicon thin films by the steady-state measurement methods. Canadian Journal of Physics, 92. 768-773 doi:10.1139/cjp-2013-0630
	Cansever, Hamza, Günes, Mehmet, Yilmaz, Gökhan, Sagban, H. Muzaffer, Smirnov, Vladimir, Finger, Friedhelm, Brüggemann, Rudolf (2014) Investigation of metastability and instability effects on the minority carrier transport properties of microcrystalline silicon thin films by using the steady-state photocarrier grating technique. Canadian Journal of Physics, 92. 763-767 doi:10.1139/cjp-2013-0629
	Yilmaz, Gökhan, Cansever, Hamza, Sagban, H. Muzaffer, Günes, Mehmet, Smirnov, Vladimir, Finger, Friedhelm, Brüggemann, Rudi (2014) Reversible and irreversible effects after oxygen exposure in thick (>1 μm) silicon films deposited by VHF-PECVD on glass substrates investigated by dual beam photoconductivity. Canadian Journal of Physics, 92. 778-782 doi:10.1139/cjp-2013-0638
	Turan, Elif, Yilmaz, Gokhan, Smirnov, Vladimir, Finger, Friedhelm, Günes, Mehmet (2012) Rapid Reversible Degradation of Silicon Thin Films by a Treatment in Water. Japanese Journal of Applied Physics, 51. 70210 doi:10.1143/jjap.51.070210
	Turan, Elif, Yilmaz, Gokhan, Smirnov, Vladimir, Finger, Friedhelm, Günes, Mehmet (2012) Rapid Reversible Degradation of Silicon Thin Films by a Treatment in Water. Japanese Journal of Applied Physics, 51 (7) 70210 doi:10.7567/jjap.51.070210
	Smirnov, V., Reynolds, S., Main, C., Finger, F., Carius, R. (2004) Aging effects in microcrystalline silicon films studied by transient photoconductivity. Journal of Non-Crystalline Solids, 338. 421-424 doi:10.1016/j.jnoncrysol.2004.03.010
	Lambertz, A., Finger, F., Holländer, B., Rath, J.K., Schropp, R.E.I. (2012) Boron-doped hydrogenated microcrystalline silicon oxide (μc-SiOx:H) for application in thin-film silicon solar cells. Journal of Non-Crystalline Solids, 358 (17) 1962-1965 doi:10.1016/j.jnoncrysol.2011.12.047
	Xiao, Lihong, Astakhov, Oleksandr, Finger, Friedhelm, Stutzmann, Martin (2012) Determination of the defect density in thin film amorphous and microcrystalline silicon from ESR measurements: The influence of the sample preparation procedure. Journal of Non-Crystalline Solids, 358 (17) 2078-2081 doi:10.1016/j.jnoncrysol.2012.01.039
	Böttler, W., Smirnov, V., Hüpkes, J., Finger, F. (2012) Variation of back reflector morphology in n–i–p microcrystalline silicon thin film solar cells using texture-etched ZnO. Journal of Non-Crystalline Solids, 358 (17) 2474-2477 doi:10.1016/j.jnoncrysol.2011.12.100
	Smirnov, V., Lambertz, A., Grootoonk, B., Carius, R., Finger, F. (2012) Microcrystalline silicon oxide (μc-SiOx:H) alloys: A versatile material for application in thin film silicon single and tandem junction solar cells. Journal of Non-Crystalline Solids, 358 (17) 1954-1957 doi:10.1016/j.jnoncrysol.2011.12.019
	Ledinský, Martin, Fejfar, Antonín, Vetushka, Aliaksei, Stuchlík, Jiří, Kočka, Jan (2012) Local photoconductivity of microcrystalline silicon thin films excited by 442nm HeCd laser measured by conductive atomic force microscopy. Journal of Non-Crystalline Solids, 358 (17) 2082-2085 doi:10.1016/j.jnoncrysol.2012.01.015