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King, S.W., French, M., Bielefeld, J., Lanford, W.A. (2011) Fourier transform infrared spectroscopy investigation of chemical bonding in low-k a-SiC:H thin films. Journal of Non-Crystalline Solids, 357 (15) 2970-2983 doi:10.1016/j.jnoncrysol.2011.04.001

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Reference TypeJournal (article/letter/editorial)
TitleFourier transform infrared spectroscopy investigation of chemical bonding in low-k a-SiC:H thin films
JournalJournal of Non-Crystalline Solids
AuthorsKing, S.W.Author
French, M.Author
Bielefeld, J.Author
Lanford, W.A.Author
Year2011 (July)Volume357
Issue15
PublisherElsevier BV
DOIdoi:10.1016/j.jnoncrysol.2011.04.001Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID648016Long-form Identifiermindat:1:5:648016:9
GUID0
Full ReferenceKing, S.W., French, M., Bielefeld, J., Lanford, W.A. (2011) Fourier transform infrared spectroscopy investigation of chemical bonding in low-k a-SiC:H thin films. Journal of Non-Crystalline Solids, 357 (15) 2970-2983 doi:10.1016/j.jnoncrysol.2011.04.001
Plain TextKing, S.W., French, M., Bielefeld, J., Lanford, W.A. (2011) Fourier transform infrared spectroscopy investigation of chemical bonding in low-k a-SiC:H thin films. Journal of Non-Crystalline Solids, 357 (15) 2970-2983 doi:10.1016/j.jnoncrysol.2011.04.001
In(2011, July) Journal of Non-Crystalline Solids Vol. 357 (15) Elsevier BV

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King, S.W., Bielefeld, J., French, M., Lanford, W.A. (2011) Mass and bond density measurements for PECVD a-SiCx:H thin films using Fourier transform-infrared spectroscopy. Journal of Non-Crystalline Solids, 357 (21) 3602-3615 doi:10.1016/j.jnoncrysol.2011.07.004
King, S.W., Bielefeld, J., French, M., Lanford, W.A. (2013) Corrigendum to “Mass and bond density measurements for PECVD a-SiCx:H thin films using Fourier transform-infrared spectroscopy” [J. Non-Cryst. Solids 357 (2011) 3602–3615]. Journal of Non-Crystalline Solids, 378. 291 doi:10.1016/j.jnoncrysol.2013.06.021
Shaik, Habibuddin, Rao, G. Mohan (2013) Critical investigation on hydrogen bonding by Fourier Transform Infrared spectroscopy in hydrogenated amorphous silicon thin films. Journal of Non-Crystalline Solids, 375. 88-94 doi:10.1016/j.jnoncrysol.2013.04.062
Bronneberg, A.C., Smets, A.H.M., Creatore, M., van de Sanden, M.C.M. (2011) On the oxidation mechanism of microcrystalline silicon thin films studied by Fourier transform infrared spectroscopy. Journal of Non-Crystalline Solids, 357 (3) 884-887 doi:10.1016/j.jnoncrysol.2010.11.001
King, Sean W., Bielefeld, Jeff, Xu, Guanghai, Lanford, William A., Matsuda, Yusuke, Dauskardt, Reinhold H., Kim, Namjun, Hondongwa, Donald, Olasov, Lauren, Daly, Brian, Stan, Gheorghe, Liu, Ming, Dutta, Dhanadeep, Gidley, David (2013) Influence of network bond percolation on the thermal, mechanical, electrical and optical properties of high and low-k a-SiC:H thin films. Journal of Non-Crystalline Solids, 379. 67-79 doi:10.1016/j.jnoncrysol.2013.07.028
King, Sean W., Ross, Liza, Li, Han, Xu, Guanghai, Bielefeld, Jeff, Atkins, Ryan E., Henneghan, Patrick D., Davis, Kathleen, Johnson, David C., Lanford, William A. (2014) Influence of hydrogen content and network connectivity on the coefficient of thermal expansion and thermal stability for a-SiC:H thin films. Journal of Non-Crystalline Solids, 389. 78-85 doi:10.1016/j.jnoncrysol.2014.02.007
Sato, Masanori, King, Sean W., Lanford, William A., Henry, Patrick, Fujiseki, Takemasa, Fujiwara, Hiroyuki (2016) Network structure of a-SiO:H layers fabricated by plasma-enhanced chemical vapor deposition: Comparison with a-SiC:H layers. Journal of Non-Crystalline Solids, 440. 49-58 doi:10.1016/j.jnoncrysol.2016.03.004
El-Denglawey, A. (2011) Characterization of As–Se–Tl films near infrared region. Journal of Non-Crystalline Solids, 357 (7) 1757-1763 doi:10.1016/j.jnoncrysol.2011.01.026
Sitarz, M. (2011) The structure of simple silicate glasses in the light of Middle Infrared spectroscopy studies. Journal of Non-Crystalline Solids, 357 (6) 1603-1608 doi:10.1016/j.jnoncrysol.2011.01.007
Studenyak, I.P., Kranjčec, M., Pop, M.M. (2011) Urbach absorption edge and disordering processes in As2S3 thin films. Journal of Non-Crystalline Solids, 357 (22) 3866-3869 doi:10.1016/j.jnoncrysol.2011.07.032
Poruba, A., Holovsky, J., Purkrt, A., Vanecek, M. (2008) Advanced optical characterization of disordered semiconductors by Fourier transform photocurrent spectroscopy. Journal of Non-Crystalline Solids, 354 (19) 2421-2425 doi:10.1016/j.jnoncrysol.2007.09.108
 
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