Smith, J., Torricelli, G., Marchi, F., Budau, P., Comin, F., Chevrier, J. (2005) Oxidation and adhesion on the quasicrystalline AlPdMn surface studied by nanolithography. Surface Science, 580 (1). 11-18 doi:10.1016/j.susc.2005.01.052

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Reference Type	Journal (article/letter/editorial)
Title	Oxidation and adhesion on the quasicrystalline AlPdMn surface studied by nanolithography
Journal	Surface Science
Authors	Smith, J.		Author
	Torricelli, G.		Author
	Marchi, F.		Author
	Budau, P.		Author
	Comin, F.		Author
	Chevrier, J.		Author
Year	2005 (April)	Volume	580
Issue	1
Publisher	Elsevier BV
DOI	doi:10.1016/j.susc.2005.01.052Search in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	6480100	Long-form Identifier	mindat:1:5:6480100:7
GUID	0
Full Reference	Smith, J., Torricelli, G., Marchi, F., Budau, P., Comin, F., Chevrier, J. (2005) Oxidation and adhesion on the quasicrystalline AlPdMn surface studied by nanolithography. Surface Science, 580 (1). 11-18 doi:10.1016/j.susc.2005.01.052
Plain Text	Smith, J., Torricelli, G., Marchi, F., Budau, P., Comin, F., Chevrier, J. (2005) Oxidation and adhesion on the quasicrystalline AlPdMn surface studied by nanolithography. Surface Science, 580 (1). 11-18 doi:10.1016/j.susc.2005.01.052
In	(2005, April) Surface Science Vol. 580 (1) Elsevier BV

	Schmithüsen, F., Cappello, G., De Boissieu, M., Boudard, M., Comin, F., Chevrier, J. (2000) Study of the response of the fivefold i-AlPdMn surface to different temperature treatments. Surface Science, 444 (1). 113-122 doi:10.1016/s0039-6028(99)00984-x
	Guillemot, C, Budau, P, Chevrier, J, Marchi, F, Comin, F, Alandi, C, Bertin, F, Buffet, N, Wyon, Ch, Mur, P (2002) Imaging of stored charges in Si quantum dots by tapping and electrostatic force microscopy. Europhysics Letters (EPL), 59. 566-571 doi:10.1209/epl/i2002-00143-x
	Pesty, F., Garoche, P. (2005) Low-energy electron beam on an insulator surface: Impact of the charging process on the diffraction by mica muscovite. Surface Science, 580 (1). 153-162 doi:10.1016/j.susc.2005.02.018
	Decossas, S., Patrone, L., Bonnot, A.M., Comin, F., Derivaz, M., Barski, A., Chevrier, J. (2003) Nanomanipulation by atomic force microscopy of carbon nanotubes on a nanostructured surface. Surface Science, 543 (1). 57-62 doi:10.1016/s0039-6028(03)00919-1
	Dianoux, R., Smilde, H. J. H., Marchi, F., Buffet, N., Mur, P., Comin, F., Chevrier, J. (2005) Kinetic roughening of charge spreading in a two-dimensional silicon nanocrystal network detected by electrostatic force microscopy. Physical Review B, 71 (12) doi:10.1103/physrevb.71.125303
	Riedo, E., Chevrier, J., Comin, F., Brune, H. (2001) Nanotribology of carbon based thin films: the influence of film structure and surface morphology. Surface Science, 477 (1). 25-34 doi:10.1016/s0039-6028(01)00701-4
	Lubarsky, G.V., Davidson, M.R., Bradley, R.H. (2004) Elastic modulus, oxidation depth and adhesion force of surface modified polystyrene studied by AFM and XPS. Surface Science, 558 (1). 135-144 doi:10.1016/j.susc.2004.03.054
	Curiotto, S., Cheynis, F., Leroy, F., Müller, P. (2016) Surface diffusion of Au on 3×3 Si(111)–Au studied by nucleation-rate and Ostwald-ripening analysis. Surface Science, 647. 8-11 doi:10.1016/j.susc.2015.11.015
	Forster, F., Bendounan, A., Ziroff, J., Reinert, F. (2006) Systematic studies on surface modifications by ARUPS on Shockley-type surface states. Surface Science, 600 (18). 3870-3874 doi:10.1016/j.susc.2006.02.065
	Qin, J., Xue, F., Huang, L., Fan, Y.L., Yang, X.J., Jiang, Z.M., Jia, Q.J., Jiang, X.M. (2005) Investigation of phosphorus surface segregation by X-ray scattering measurements. Surface Science, 580 (1). 51-56 doi:10.1016/j.susc.2005.02.002
	*Fauster, Thomas, Weinelt, Martin (2005) Carrier dynamics on surfaces studied by two-photon photoemission. Surface Science, 593 (1). 1-11 doi:10.1016/j.susc.2005.06.040*

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Smith, J., Torricelli, G., Marchi, F., Budau, P., Comin, F., Chevrier, J. (2005) Oxidation and adhesion on the quasicrystalline AlPdMn surface studied by nanolithography. Surface Science, 580 (1). 11-18 doi:10.1016/j.susc.2005.01.052

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