Yamamoto, Yuichi, Yamamoto, Kiyoshi (2010) Precise XPS depth profile of soda-lime-silica glass using C60 ion beam. Journal of Non-Crystalline Solids, 356 (1) 14-18 doi:10.1016/j.jnoncrysol.2009.09.027
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Precise XPS depth profile of soda-lime-silica glass using C60 ion beam | ||
| Journal | Journal of Non-Crystalline Solids | ||
| Authors | Yamamoto, Yuichi | Author | |
| Yamamoto, Kiyoshi | Author | ||
| Year | 2010 (January) | Volume | 356 |
| Issue | 1 | ||
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/j.jnoncrysol.2009.09.027Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 647164 | Long-form Identifier | mindat:1:5:647164:8 |
| GUID | 0 | ||
| Full Reference | Yamamoto, Yuichi, Yamamoto, Kiyoshi (2010) Precise XPS depth profile of soda-lime-silica glass using C60 ion beam. Journal of Non-Crystalline Solids, 356 (1) 14-18 doi:10.1016/j.jnoncrysol.2009.09.027 | ||
| Plain Text | Yamamoto, Yuichi, Yamamoto, Kiyoshi (2010) Precise XPS depth profile of soda-lime-silica glass using C60 ion beam. Journal of Non-Crystalline Solids, 356 (1) 14-18 doi:10.1016/j.jnoncrysol.2009.09.027 | ||
| In | (2010, January) Journal of Non-Crystalline Solids Vol. 356 (1) Elsevier BV | ||
See Also
These are possibly similar items as determined by title/reference text matching only.
