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Ventura, J., Teixeira, J.M., Araujo, J.P., Carpinteiro, F., Sousa, J.B., Zhang, Z., Liu, Y., Freitas, P.P. (2008) Asymmetric electromigration-driven resistive switching in tunnel junctions. Journal of Non-Crystalline Solids, 354 (47) 5272-5274 doi:10.1016/j.jnoncrysol.2008.04.050

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Reference TypeJournal (article/letter/editorial)
TitleAsymmetric electromigration-driven resistive switching in tunnel junctions
JournalJournal of Non-Crystalline Solids
AuthorsVentura, J.Author
Teixeira, J.M.Author
Araujo, J.P.Author
Carpinteiro, F.Author
Sousa, J.B.Author
Zhang, Z.Author
Liu, Y.Author
Freitas, P.P.Author
Year2008 (December)Volume354
Issue47
PublisherElsevier BV
DOIdoi:10.1016/j.jnoncrysol.2008.04.050Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID646441Long-form Identifiermindat:1:5:646441:1
GUID0
Full ReferenceVentura, J., Teixeira, J.M., Araujo, J.P., Carpinteiro, F., Sousa, J.B., Zhang, Z., Liu, Y., Freitas, P.P. (2008) Asymmetric electromigration-driven resistive switching in tunnel junctions. Journal of Non-Crystalline Solids, 354 (47) 5272-5274 doi:10.1016/j.jnoncrysol.2008.04.050
Plain TextVentura, J., Teixeira, J.M., Araujo, J.P., Carpinteiro, F., Sousa, J.B., Zhang, Z., Liu, Y., Freitas, P.P. (2008) Asymmetric electromigration-driven resistive switching in tunnel junctions. Journal of Non-Crystalline Solids, 354 (47) 5272-5274 doi:10.1016/j.jnoncrysol.2008.04.050
In(2008, December) Journal of Non-Crystalline Solids Vol. 354 (47) Elsevier BV

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