Vladár, András E., Postek, Michael T., Davilla, Scott D. (2006) Is your scanning electron microscope Hi-Fi?. Scanning, 17 (5). 287-295 doi:10.1002/sca.4950170504

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Reference Type	Journal (article/letter/editorial)
Title	Is your scanning electron microscope Hi-Fi?
Journal	Scanning
Authors	Vladár, András E.		Author
	Postek, Michael T.		Author
	Davilla, Scott D.		Author
Year	2006 (December 7)	Volume	17
Issue	5
Publisher	Wiley
DOI	doi:10.1002/sca.4950170504Search in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	6445282	Long-form Identifier	mindat:1:5:6445282:9
GUID	0
Full Reference	Vladár, András E., Postek, Michael T., Davilla, Scott D. (2006) Is your scanning electron microscope Hi-Fi?. Scanning, 17 (5). 287-295 doi:10.1002/sca.4950170504
Plain Text	Vladár, András E., Postek, Michael T., Davilla, Scott D. (2006) Is your scanning electron microscope Hi-Fi?. Scanning, 17 (5). 287-295 doi:10.1002/sca.4950170504
In	(2006, December) Scanning Vol. 17 (5) Wiley

	*Vladár, AndráS E., Radi, Zsolt, Postek, Michael T., Joy, David C. (2006) Nanotip electron gun for the scanning electron microscope. Scanning, 28 (3). 133-141 doi:10.1002/sca.4950280301*
	*Postek, Michael T., Vladár, András E. (2006) Digital imaging for scanning electron microscopy. Scanning, 18 (1). 1-7 doi:10.1002/sca.1996.4950180101*
	*Postek, Michael T., Vladár, András E. (2011) Modeling for accurate dimensional scanning electron microscope metrology: then and now. Scanning, 33 (3). 111-125 doi:10.1002/sca.20238*
	Postek, Michael T., Vladár, András E., Lowney, Jeremiah R., Keery, William J. (2006) Two-dimensional simulation and modeling in scanning electron microscope imaging and metrology research. Scanning, 24 (4). 179-185 doi:10.1002/sca.4950240404
	Zhang, Nien Fan, Postek, Michael T., Larrabee, Robert D., Vladár, András E., Keery, William J., Jones, Samuel N. (2006) Image sharpness measurement in the scanning electron microscope-Part III. Scanning, 21 (4). 246-252 doi:10.1002/sca.4950210404
	*Chae Postek, M. L. T., Vladár, András E. (2006) Image sharpness measurement in scanning electron microscopy-part I. Scanning, 20 (1). 1-9 doi:10.1002/sca.1998.4950200101*
	Postek, Michael T., Vladár, András E., Wells, Oliver C., Lowney, Jerry L. (2006) Application of the low-loss scanning electron microscope image to integrated circuit technology. Part 1- applications to accurate dimension measurements. Scanning, 23 (5). 298-304 doi:10.1002/sca.4950230502
	Wells, Oliver C., McGlashan-Powell, Maurice, Vladár, András E., Postek, Michael T. (2006) Application of the low-loss scanning electron microscope image to integrated circuit technology. Part II- chemically-mechanically planarized samples. Scanning, 23 (6). 366-371 doi:10.1002/sca.4950230602
	Postek, Michael T., Vladár, András E. (2006) New application of variable-pressure/environmental microscopy to semiconductor inspection and metrology. Scanning, 26 (1). 11-17 doi:10.1002/sca.4950260103
	*Postek, Michael T., Vladár, András E. (2013) Does your SEM Really tell the truth?-how would you know? Part 1. Scanning, 35 (6). 355-361 doi:10.1002/sca.21075*
	*Vladár, Andrá E., Postek, Michael T., Davidson, Mark. P. (2006) Image sharpness measurement in scanning electron microscopy-part II. Scanning, 20 (1). 24-34 doi:10.1002/sca.1998.4950200104*

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Vladár, András E., Postek, Michael T., Davilla, Scott D. (2006) Is your scanning electron microscope Hi-Fi?. Scanning, 17 (5). 287-295 doi:10.1002/sca.4950170504

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