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Kunii, Toshie, Honda, Takashi, Yoshida, Norimitsu, Nonomura, Shuichi (2006) Optical properties of microcrystalline 3C–SiC:H films measured by resonant photothermal bending spectroscopy. Journal of Non-Crystalline Solids, 352 (9) 1196-1199 doi:10.1016/j.jnoncrysol.2006.01.074

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Reference TypeJournal (article/letter/editorial)
TitleOptical properties of microcrystalline 3C–SiC:H films measured by resonant photothermal bending spectroscopy
JournalJournal of Non-Crystalline Solids
AuthorsKunii, ToshieAuthor
Honda, TakashiAuthor
Yoshida, NorimitsuAuthor
Nonomura, ShuichiAuthor
Year2006 (June)Volume352
Issue9
PublisherElsevier BV
DOIdoi:10.1016/j.jnoncrysol.2006.01.074Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID644489Long-form Identifiermindat:1:5:644489:5
GUID0
Full ReferenceKunii, Toshie, Honda, Takashi, Yoshida, Norimitsu, Nonomura, Shuichi (2006) Optical properties of microcrystalline 3C–SiC:H films measured by resonant photothermal bending spectroscopy. Journal of Non-Crystalline Solids, 352 (9) 1196-1199 doi:10.1016/j.jnoncrysol.2006.01.074
Plain TextKunii, Toshie, Honda, Takashi, Yoshida, Norimitsu, Nonomura, Shuichi (2006) Optical properties of microcrystalline 3C–SiC:H films measured by resonant photothermal bending spectroscopy. Journal of Non-Crystalline Solids, 352 (9) 1196-1199 doi:10.1016/j.jnoncrysol.2006.01.074
In(2006, June) Journal of Non-Crystalline Solids Vol. 352 (9) Elsevier BV

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Kunii, Toshie, Yoshida, Norimitsu, Hori, Yasuro, Nonomura, Shuichi (2006) Optical Absorption Spectra of Hydrogenated Microcrystalline Silicon Films by Resonant Photothermal Bending Spectroscopy. Japanese Journal of Applied Physics, 45 (5) 3913-3921 doi:10.1143/jjap.45.3913
Yoshida, Norimitsu, Shimizu, Yasuko, Honda, Takashi, Yokoi, Toshiaki, Nonomura, Shuichi (2008) A study of absorption coefficient spectra in a-Si:H films near the transition from amorphous to crystalline phase measured by resonant photothermal bending spectroscopy. Journal of Non-Crystalline Solids, 354 (19) 2164-2166 doi:10.1016/j.jnoncrysol.2007.10.039
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Hirota, Yuta, Kato, Hiroki, Kawahara, Kouki, Yoshida, Norimitsu, Nonomura, Shuichi (2018) Optical absorption spectra of perovskite thin films for defect estimation by photothermal bending spectroscopy. Japanese Journal of Applied Physics, 57 (8) 8 doi:10.7567/jjap.57.08re07
Kunii, T., Mori, K., Kiriyama, T., Kitao, J., Yoshida, N., Nonomura, S. (2003) Resonant photothermal bending spectroscopy at variable temperature 25–150 °C and its application to hydrogenated microcrystalline silicon films. Review of Scientific Instruments, 74 (1). 881-883 doi:10.1063/1.1517152
Yoshida, Shigeru, Itoh, Takashi, Takada, Naoyuki, Nitta, Shoji, Nonomura, Shuichi (1998) Characterization of nitrogen in a-CN thin films by gas effusion spectroscopy. Journal of Non-Crystalline Solids, 227. 650-654 doi:10.1016/s0022-3093(98)00137-9
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