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Kobayashi, Keiji (1997) Improvement of polarizable capacitance—voltage curves of MOS capacitors passivated with BN-and PbF2-containing SiO2B2O3GeO2 glasses. Journal of Non-Crystalline Solids, 217 (2) 323-328 doi:10.1016/s0022-3093(97)00138-5

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Reference TypeJournal (article/letter/editorial)
TitleImprovement of polarizable capacitance—voltage curves of MOS capacitors passivated with BN-and PbF2-containing SiO2B2O3GeO2 glasses
JournalJournal of Non-Crystalline Solids
AuthorsKobayashi, KeijiAuthor
Year1997 (September)Volume217
Issue2
PublisherElsevier BV
DOIdoi:10.1016/s0022-3093(97)00138-5Search in ResearchGate
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Mindat Ref. ID636465Long-form Identifiermindat:1:5:636465:0
GUID0
Full ReferenceKobayashi, Keiji (1997) Improvement of polarizable capacitance—voltage curves of MOS capacitors passivated with BN-and PbF2-containing SiO2B2O3GeO2 glasses. Journal of Non-Crystalline Solids, 217 (2) 323-328 doi:10.1016/s0022-3093(97)00138-5
Plain TextKobayashi, Keiji (1997) Improvement of polarizable capacitance—voltage curves of MOS capacitors passivated with BN-and PbF2-containing SiO2B2O3GeO2 glasses. Journal of Non-Crystalline Solids, 217 (2) 323-328 doi:10.1016/s0022-3093(97)00138-5
In(1997, September) Journal of Non-Crystalline Solids Vol. 217 (2) Elsevier BV

See Also

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Kobayashi, Keiji, Mizushima, Ichiro (1994) OH-related capacitance-voltage recovery effect in MOS capacitors passivated by PbOB2O3SiO2GeO2 glasses. The effects of OH content. Journal of Non-Crystalline Solids, 180 (1) 84-87 doi:10.1016/0022-3093(94)90400-6
Kobayashi, Keiji (1997) Capacitance–voltage curve recovery of MOS capacitors passivated with BaF2–BeF2–SiO2 –B2O3–P2O5 glasses. Journal of Materials Chemistry, 7. 127-129 doi:10.1039/a602563c
Kobayashi, Keiji (1989) DTA and MOS characteristics for PbOB2O3SiO2GeO2 passivation glasses. Journal of Non-Crystalline Solids, 109 (2) 277-279 doi:10.1016/0022-3093(89)90040-9
Kobayashi, Keiji (1995) OH-Related Capacitance-Voltage Recovery Effect in MOS Capacitors Passivated by Fluoride-Containing ZnO-B2O3-SiO2-P2O5 Glasses. Journal of Solid State Chemistry, 118. 212-214 doi:10.1006/jssc.1995.1335
Kobayashi, K. (1995) OH-related capacitance-voltage recovery effect in MOS capacitors passivated by PbO-B2O3-SiO2-GeO2 glasses Part V The effects of B2O3 content. Journal of Materials Science Letters, 14 (1) 6-8 doi:10.1007/bf02565268
Kobayashi, Keiji, Mizushima, Ichiro (1996) OH-related capacitance-voltage recovery effect in MOS capacitors passivated by ZnO-B2O3-SiO2-P2O5 glasses part VIIIthe effects of SrF 2 and BeO contents. Journal of Materials Science Letters, 15 (4) 357-359 doi:10.1007/bf00591662
Kobayashi, Keiji (1994) Optical, polarizable and MOS properties of crystallizable ZnO and PbO-based glasses. Journal of Non-Crystalline Solids, 176 (2) 208-212 doi:10.1016/0022-3093(94)90079-5
Kobayashi, K. (1995) OH-related capacitance-voltage recovery effect in MOS capacitors passivated by PbO-B2O3-SiO2-MgO glasses VII, the effects of MgO content. Journal of Materials Science Letters, 14 (10) doi:10.1007/bf00253379
Kobayashi, Keiji (1990) Thermogravimetric and MOS capacitor properties for PbOBi2O3B2O3SiO2 glass system. Journal of Non-Crystalline Solids, 124 (2) 229-232 doi:10.1016/0022-3093(90)90267-p
Kobayashi, K. (1995) OH-related capacitance-voltage recovery effect in MOS capacitors passivated by PbO-B2O3-SiO2-CaO glasses Part VI The effects of CaO content. Journal of Materials Science Letters, 14 (9) 626-628 doi:10.1007/bf00586160
Kobayashi, Keiji (1987) Polarizable capacitance versus voltage characteristics for metal, oxide, and silicon capacitors passivated by various oxide glasses. Applied Physics Letters, 51 (20). 1600-1601 doi:10.1063/1.98567
 
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