Connor, M.W., Colmenares, C. (1996) X-ray photoelectron characterization of SiO2 aerogel. Journal of Non-Crystalline Solids, 201 (1) 76-80 doi:10.1016/0022-3093(95)00622-2
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | X-ray photoelectron characterization of SiO2 aerogel | ||
| Journal | Journal of Non-Crystalline Solids | ||
| Authors | Connor, M.W. | Author | |
| Colmenares, C. | Author | ||
| Year | 1996 (June) | Volume | 201 |
| Issue | 1 | ||
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/0022-3093(95)00622-2Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 635649 | Long-form Identifier | mindat:1:5:635649:5 |
| GUID | 0 | ||
| Full Reference | Connor, M.W., Colmenares, C. (1996) X-ray photoelectron characterization of SiO2 aerogel. Journal of Non-Crystalline Solids, 201 (1) 76-80 doi:10.1016/0022-3093(95)00622-2 | ||
| Plain Text | Connor, M.W., Colmenares, C. (1996) X-ray photoelectron characterization of SiO2 aerogel. Journal of Non-Crystalline Solids, 201 (1) 76-80 doi:10.1016/0022-3093(95)00622-2 | ||
| In | (1996, June) Journal of Non-Crystalline Solids Vol. 201 (1) Elsevier BV | ||
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