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Beltrán, M.R. (1993) A model of interface defect states at Si/SiO2 amorphous (non-periodic) interfaces. Journal of Non-Crystalline Solids, 163 (2) 148-161 doi:10.1016/0022-3093(93)90763-n

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Reference TypeJournal (article/letter/editorial)
TitleA model of interface defect states at Si/SiO2 amorphous (non-periodic) interfaces
JournalJournal of Non-Crystalline Solids
AuthorsBeltrán, M.R.Author
Year1993 (November)Volume163
Issue2
PublisherElsevier BV
DOIdoi:10.1016/0022-3093(93)90763-nSearch in ResearchGate
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Mindat Ref. ID633262Long-form Identifiermindat:1:5:633262:8
GUID0
Full ReferenceBeltrán, M.R. (1993) A model of interface defect states at Si/SiO2 amorphous (non-periodic) interfaces. Journal of Non-Crystalline Solids, 163 (2) 148-161 doi:10.1016/0022-3093(93)90763-n
Plain TextBeltrán, M.R. (1993) A model of interface defect states at Si/SiO2 amorphous (non-periodic) interfaces. Journal of Non-Crystalline Solids, 163 (2) 148-161 doi:10.1016/0022-3093(93)90763-n
In(1993, November) Journal of Non-Crystalline Solids Vol. 163 (2) Elsevier BV

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