Schoening, F. R. L. (1967) Instrumental corrections for X-ray reflexions from thin monocrystalline films. Acta Crystallographica, 23 (4) 535-537 doi:10.1107/s0365110x67003159

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Reference Type	Journal (article/letter/editorial)
Title	Instrumental corrections for X-ray reflexions from thin monocrystalline films
Journal	Acta Crystallographica
Authors	Schoening, F. R. L.		Author
Year	1967 (October 10)	Volume	23
Issue	4
Publisher	International Union of Crystallography (IUCr)
DOI	doi:10.1107/s0365110x67003159Search in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	625429	Long-form Identifier	mindat:1:5:625429:6
GUID	0
Full Reference	Schoening, F. R. L. (1967) Instrumental corrections for X-ray reflexions from thin monocrystalline films. Acta Crystallographica, 23 (4) 535-537 doi:10.1107/s0365110x67003159
Plain Text	Schoening, F. R. L. (1967) Instrumental corrections for X-ray reflexions from thin monocrystalline films. Acta Crystallographica, 23 (4) 535-537 doi:10.1107/s0365110x67003159
In	(1967, October) Acta Crystallographica Vol. 23 (4) International Union of Crystallography (IUCr)

	*Schoening, F. R. L. (1965) Strain and particle size values from X-ray line breadths. Acta Crystallographica, 18 (5) 975-976 doi:10.1107/s0365110x65002335*
	van Niekerk, J. N., Schoening, F. R. L. (1951) A preliminary X-ray investigation of potassium- and ammoniumtrioxalatochromate. III. Acta Crystallographica, 4 (4) 381-382 doi:10.1107/s0365110x51001239
	Schoening, F. R. L., Witt, F. (1965) Use of an elastic model in calculating the X-ray scattering from the interstitial Ti–O solid solution. Acta Crystallographica, 18 (4) 609-614 doi:10.1107/s0365110x65001445
	*Rachinger, W. A. (1950) Anomalous X-ray reflexions from copper crystals. Acta Crystallographica, 3 (4) 312-313 doi:10.1107/s0365110x50000781*
	*Hoerni, J. A., Wooster, W. A. (1955) The X-ray anomalous reflexions from diamond. Acta Crystallographica, 8 (4) 187-194 doi:10.1107/s0365110x55000686*
	*Rae, A. D. (1965) The correlation of zones of X-ray intensity data from common reflexions. Acta Crystallographica, 19 (4) 683-684 doi:10.1107/s0365110x65004139*
	*van Niekerk, J. N., Schoening, F. R. L. (1951) An experimentally determined atomic scattering-factor curve for chromium. Acta Crystallographica, 4 (4) 382-383 doi:10.1107/s0365110x51001240*
	*Hazell, A. C. (1967) Anomalous scattering corrections for X-rays β-radiations. Acta Crystallographica, 23 (6) 1096-1098 doi:10.1107/s0365110x67004323*
	*Vook, R. W., Schoening, F. R. L. (1963) X‐Ray Diffractometer Attachment for Direct Observation of Evaporated Thin Films. Review of Scientific Instruments, 34 (7). 792-793 doi:10.1063/1.1718576*
	*Jeffery, J. W. (1967) The errors in the measurement of intensities from X-ray photographs. Acta Crystallographica, 23 (4) 673 doi:10.1107/s0365110x67003433*
	*Mackay, A. L. (1952) Setting a single crystal by non-equatorial X-ray reflexions. Acta Crystallographica, 5 (5) 691 doi:10.1107/s0365110x52001921*

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Schoening, F. R. L. (1967) Instrumental corrections for X-ray reflexions from thin monocrystalline films. Acta Crystallographica, 23 (4) 535-537 doi:10.1107/s0365110x67003159

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