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Deryabin, A. S., Sokolov, L. V., Trukhanov, E. M., Fritzler, K. B. (2018) The Reliability of Revealing Threading Dislocations in Epitaxial Films by Structure-Sensitive Etching. Technical Physics Letters, 44. 916-918 doi:10.1134/s1063785018100218

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Reference TypeJournal (article/letter/editorial)
TitleThe Reliability of Revealing Threading Dislocations in Epitaxial Films by Structure-Sensitive Etching
JournalTechnical Physics Letters
AuthorsDeryabin, A. S.Author
Sokolov, L. V.Author
Trukhanov, E. M.Author
Fritzler, K. B.Author
Year2018 (October)Volume44
PublisherPleiades Publishing Ltd
DOIdoi:10.1134/s1063785018100218Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID6209732Long-form Identifiermindat:1:5:6209732:7
GUID0
Full ReferenceDeryabin, A. S., Sokolov, L. V., Trukhanov, E. M., Fritzler, K. B. (2018) The Reliability of Revealing Threading Dislocations in Epitaxial Films by Structure-Sensitive Etching. Technical Physics Letters, 44. 916-918 doi:10.1134/s1063785018100218
Plain TextDeryabin, A. S., Sokolov, L. V., Trukhanov, E. M., Fritzler, K. B. (2018) The Reliability of Revealing Threading Dislocations in Epitaxial Films by Structure-Sensitive Etching. Technical Physics Letters, 44. 916-918 doi:10.1134/s1063785018100218
In(n.d.) Technical Physics Letters Vol. 44. Pleiades Publishing Ltd

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