Podlivaev, A. I., Pokrovskii, S. V., Anischenko, I. V., Rudnev, I. A. (2017) Precise Magnetometric Diagnostics of Critical-Current Inhomogeneities in High-Temperature Semiconductor Tapes. Technical Physics Letters, 43. 1136-1139 doi:10.1134/s1063785017120240
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Precise Magnetometric Diagnostics of Critical-Current Inhomogeneities in High-Temperature Semiconductor Tapes | ||
| Journal | Technical Physics Letters | ||
| Authors | Podlivaev, A. I. | Author | |
| Pokrovskii, S. V. | Author | ||
| Anischenko, I. V. | Author | ||
| Rudnev, I. A. | Author | ||
| Year | 2017 (December) | Volume | 43 |
| Publisher | Pleiades Publishing Ltd | ||
| DOI | doi:10.1134/s1063785017120240Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 6209480 | Long-form Identifier | mindat:1:5:6209480:7 |
| GUID | 0 | ||
| Full Reference | Podlivaev, A. I., Pokrovskii, S. V., Anischenko, I. V., Rudnev, I. A. (2017) Precise Magnetometric Diagnostics of Critical-Current Inhomogeneities in High-Temperature Semiconductor Tapes. Technical Physics Letters, 43. 1136-1139 doi:10.1134/s1063785017120240 | ||
| Plain Text | Podlivaev, A. I., Pokrovskii, S. V., Anischenko, I. V., Rudnev, I. A. (2017) Precise Magnetometric Diagnostics of Critical-Current Inhomogeneities in High-Temperature Semiconductor Tapes. Technical Physics Letters, 43. 1136-1139 doi:10.1134/s1063785017120240 | ||
| In | (n.d.) Technical Physics Letters Vol. 43. Pleiades Publishing Ltd | ||
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