Tchen, T. (2003) The diffraction focusing of X-rays upon backscattering from a bent crystal covered with epitaxial film: Sensitivity with respect to the interplanar spacing mismatch between film and substrate. Technical Physics Letters, 29. 125-127 doi:10.1134/1.1558745
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | The diffraction focusing of X-rays upon backscattering from a bent crystal covered with epitaxial film: Sensitivity with respect to the interplanar spacing mismatch between film and substrate | ||
| Journal | Technical Physics Letters | ||
| Authors | Tchen, T. | Author | |
| Year | 2003 (February) | Volume | 29 |
| Publisher | Pleiades Publishing Ltd | ||
| DOI | doi:10.1134/1.1558745Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 6204949 | Long-form Identifier | mindat:1:5:6204949:0 |
| GUID | 0 | ||
| Full Reference | Tchen, T. (2003) The diffraction focusing of X-rays upon backscattering from a bent crystal covered with epitaxial film: Sensitivity with respect to the interplanar spacing mismatch between film and substrate. Technical Physics Letters, 29. 125-127 doi:10.1134/1.1558745 | ||
| Plain Text | Tchen, T. (2003) The diffraction focusing of X-rays upon backscattering from a bent crystal covered with epitaxial film: Sensitivity with respect to the interplanar spacing mismatch between film and substrate. Technical Physics Letters, 29. 125-127 doi:10.1134/1.1558745 | ||
| In | (n.d.) Technical Physics Letters Vol. 29. Pleiades Publishing Ltd | ||
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