Parchinskii, P. B., Vlasov, S. I., Muminov, R. A., Ismailov, Kh. Kh., Turgunov, U. T. (2000) The effect of ultrasound on the parameters of metal-dielectric-semiconductor structures. Technical Physics Letters, 26. 420-422 doi:10.1134/1.1262865

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Reference Type	Journal (article/letter/editorial)
Title	The effect of ultrasound on the parameters of metal-dielectric-semiconductor structures
Journal	Technical Physics Letters
Authors	Parchinskii, P. B.		Author
	Vlasov, S. I.		Author
	Muminov, R. A.		Author
	Ismailov, Kh. Kh.		Author
	Turgunov, U. T.		Author
Year	2000 (May)	Volume	26
Publisher	Pleiades Publishing Ltd
DOI	doi:10.1134/1.1262865Search in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	6203971	Long-form Identifier	mindat:1:5:6203971:2
GUID	0
Full Reference	Parchinskii, P. B., Vlasov, S. I., Muminov, R. A., Ismailov, Kh. Kh., Turgunov, U. T. (2000) The effect of ultrasound on the parameters of metal-dielectric-semiconductor structures. Technical Physics Letters, 26. 420-422 doi:10.1134/1.1262865
Plain Text	Parchinskii, P. B., Vlasov, S. I., Muminov, R. A., Ismailov, Kh. Kh., Turgunov, U. T. (2000) The effect of ultrasound on the parameters of metal-dielectric-semiconductor structures. Technical Physics Letters, 26. 420-422 doi:10.1134/1.1262865
In	(n.d.) Technical Physics Letters Vol. 26. Pleiades Publishing Ltd

	Abdurakhmonov, S. M., Kuldashov, O. Kh., Tozhiboev, I. T., Turgunov, B. Kh. (2019) The Optoelectronic Two-Wave Method for Remote Monitoring of the Content of Methane in Atmosphere. Technical Physics Letters, 45. 132-133 doi:10.1134/s1063785019020214
	*Parchinskii, P. B., Vlasov, S. I., Turgunov, U. T. (2002) Inorganic Materials, 38 (6) Springer Science and Business Media LLC. 621-624 doi:10.1023/a:1015877822030*
	Parchinskii, P. B., Vlasov, S. I., Ligai, L. G., Shchukina, O. Yu. (2003) The effect of ultrasonic treatment on the generation characteristics of a Si-SiO2 interface. Technical Physics Letters, 29. 392-394 doi:10.1134/1.1579804
	Kamilov, T. S., Kabilov, D. K., Samiev, I. S., Khusnutdinova, Kh. Kh., Muminov, R. A., Klechkovskaya, V. V. (2005) Formation of higher manganese silicide films on silicon. Technical Physics, 50 (8). 1102-1104 doi:10.1134/1.2014547
	Muminov, R. A., Zaveryukhin, B. N., Krevchik, V. D., Ismailov, Kh. Kh., Shamagdiev, A. Sh. (1984) Temperature intervals of Si(Li)p-i-n detector use. Soviet Atomic Energy, 57. 665-667 doi:10.1007/bf01122344
	Vlasov, S. I., Parchinskii, P. B., Nasirov, A. A., Olmatov, B. A. (1999) On the nature of the mobile charge in passivating coatings based on lead-borosilicate glasses. Technical Physics, 44 (8). 998-999 doi:10.1134/1.1259424
	Magerramov, A. M., Mamedova, R. L., Ismailov, I. M., Bagirbekov, Kh. V. (2017) The Dielectric properties of polypropylene/Na+ montmorillonite nanoclays upon heating and cooling. Technical Physics, 62 (9). 1377-1380 doi:10.1134/s106378421709016x
	Parchinskii, P. B., Vlasov, S. I., Nasirov, A. A. (2001) Slowly relaxing charge in lead borosilicate glass passive coatings studied by isothermal capacitance relaxation. Technical Physics Letters, 27. 786-788 doi:10.1134/1.1407360
	Vlasov, S. I., Nazyrov, D. É., Iminov, A. A., Khudaiberdiev, S. S. (2000) Effect of heat treatment on the properties of erbium-doped silicon. Technical Physics Letters, 26. 328-329 doi:10.1134/1.1262833
	Vlasov, S. I., Ovsyannikov, A. V., Zaveryukhin, B. N. (2009) Effect of ultrasonic treatment on the generation characteristics of a semiconductor-glass interface. Technical Physics Letters, 35. 312-314 doi:10.1134/s1063785009040075
	Salikhov, T. Kh., Tabarov, S. Kh., Rashidov, D., Tuichiev, Sh., Hussain, A. (2009) Effect of C60 fullerene additives on the thermal conductivity of poly(methyl methacrylate) films. Technical Physics Letters, 35. 1010-1011 doi:10.1134/s106378500911011x

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Parchinskii, P. B., Vlasov, S. I., Muminov, R. A., Ismailov, Kh. Kh., Turgunov, U. T. (2000) The effect of ultrasound on the parameters of metal-dielectric-semiconductor structures. Technical Physics Letters, 26. 420-422 doi:10.1134/1.1262865

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