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Vorob’ev, A. K., Vostokov, N. V., Gaponov, S. V., Klyuenkov, E. B., Mironov, V. L. (1999) Investigation of inhomogeneities in thin films of high-temperature superconductors by scanning probe microscopy. Technical Physics Letters, 25. 154-156 doi:10.1134/1.1262384

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Reference TypeJournal (article/letter/editorial)
TitleInvestigation of inhomogeneities in thin films of high-temperature superconductors by scanning probe microscopy
JournalTechnical Physics Letters
AuthorsVorob’ev, A. K.Author
Vostokov, N. V.Author
Gaponov, S. V.Author
Klyuenkov, E. B.Author
Mironov, V. L.Author
Year1999 (February)Volume25
PublisherPleiades Publishing Ltd
DOIdoi:10.1134/1.1262384Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID6203496Long-form Identifiermindat:1:5:6203496:6
GUID0
Full ReferenceVorob’ev, A. K., Vostokov, N. V., Gaponov, S. V., Klyuenkov, E. B., Mironov, V. L. (1999) Investigation of inhomogeneities in thin films of high-temperature superconductors by scanning probe microscopy. Technical Physics Letters, 25. 154-156 doi:10.1134/1.1262384
Plain TextVorob’ev, A. K., Vostokov, N. V., Gaponov, S. V., Klyuenkov, E. B., Mironov, V. L. (1999) Investigation of inhomogeneities in thin films of high-temperature superconductors by scanning probe microscopy. Technical Physics Letters, 25. 154-156 doi:10.1134/1.1262384
In(n.d.) Technical Physics Letters Vol. 25. Pleiades Publishing Ltd

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Vorob’ev, A. K., Gaponov, S. V., Gusev, S. A., Drozdov, Yu. N., Klyuenkov, E. B., Luchin, V. I. (1998) Influence of working gas pressure on the properties of thin films of high-temperature superconductors obtained by magnetron sputtering. Technical Physics Letters, 24. 159-161 doi:10.1134/1.1262035
Vorob’ev, A. K., Gaponov, S. V., Drozdov, M. N., Klyuenkov, E. B., Luchin, V. I., Masterov, D. V. (1998) Influence of desorption on the composition of high-temperature superconducting thin films during magnetron sputtering. Technical Physics Letters, 24. 952-953 doi:10.1134/1.1262329
Vorobiev, A. K., Vostokov, N. V., Gaponov, S. V., Drozdov, Yu. N., Klyuenkov, E. B., Nozdrin, Yu. N. (2001) Special features in the synthesis and properties of thin Y-Ba-Cu-O high-temperature superconductor films free of secondary phases. Technical Physics Letters, 27. 197-199 doi:10.1134/1.1359824
Gaponov, S. V., Dryakhlushin, V. F., Mironov, V. L., Revin, D. G. (1997) Investigation of the photoluminescence and modification of InGaP/GaAs/InGaAs heterostructures by near-field scanning microscopy. Technical Physics Letters, 23. 624-625 doi:10.1134/1.1261773
Vorob’ev, A. K., Gaponov, S. V., Drozdov, M. N., Klyuenkov, E. B., Masterov, D. V. (2000) Investigation of the compositional changes of a Y-Ba-Cu-O HTSC target under ion sputtering. Physics of the Solid State, 42. 603-608 doi:10.1134/1.1131256
Vostokov, N. V., Gaponov, S. V., Gribkov, B. A., Drozdov, Yu. N., Masterov, D. V., Mironov, V. L., Nozdrin, Yu. N., Pestov, E. E. (2003) Effect of cation composition on the superconducting properties and on the microstructure of YBaCuO thin films. Physics of the Solid State, 45. 2025-2030 doi:10.1134/1.1626732
Aleshkin, V. Ya., Biryukov, A. V., Gaponov, S. V., Krasil’nik, Z. F., Mironov, V. L. (2000) The use of a scanning tunneling microscope (STM) for investigation of local photoconductivity of quantum-dimensional semiconductor structures. Technical Physics Letters, 26. 1-3 doi:10.1134/1.1262718
Arbuzov, V. L., Shal’nov, K. V., Danilov, S. E., Davletshin, A. É., Pecherkina, N. L., Sagaradze, V. V. (1999) Observation of segregation deposits in iron-nickel-titanium alloy using scanning tunneling microscopy. Technical Physics Letters, 25. 134-135 doi:10.1134/1.1262377
Lozovskii, V. N., Chebotarev, S. N., Irkha, V. A., Valov, G. V. (2010) Formation and use of positioning marks in scanning probe microscopy. Technical Physics Letters, 36. 737-738 doi:10.1134/s1063785010080171
Solov#x2019;ev, V. A., Gaevskii, M. É., Konnikov, S. G., Suris, R. A., Bobyl#x2019;, A. V. (1997) Investigation of transient processes in YBaCuO films by low-temperature scanning electron microscopy. Technical Physics Letters, 23. 877-880 doi:10.1134/1.1261918
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