Shuaibov, A. K. (1998) Use of a transverse nanosecond discharge at the prebreakdown electron ionization multiplication stage for selective excitation of neon atoms. Technical Physics Letters, 24. 38-40 doi:10.1134/1.1261984
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Use of a transverse nanosecond discharge at the prebreakdown electron ionization multiplication stage for selective excitation of neon atoms | ||
| Journal | Technical Physics Letters | ||
| Authors | Shuaibov, A. K. | Author | |
| Year | 1998 (January) | Volume | 24 |
| Publisher | Pleiades Publishing Ltd | ||
| DOI | doi:10.1134/1.1261984Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 6202989 | Long-form Identifier | mindat:1:5:6202989:4 |
| GUID | 0 | ||
| Full Reference | Shuaibov, A. K. (1998) Use of a transverse nanosecond discharge at the prebreakdown electron ionization multiplication stage for selective excitation of neon atoms. Technical Physics Letters, 24. 38-40 doi:10.1134/1.1261984 | ||
| Plain Text | Shuaibov, A. K. (1998) Use of a transverse nanosecond discharge at the prebreakdown electron ionization multiplication stage for selective excitation of neon atoms. Technical Physics Letters, 24. 38-40 doi:10.1134/1.1261984 | ||
| In | (n.d.) Technical Physics Letters Vol. 24. Pleiades Publishing Ltd | ||
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