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Lomov, A. A., Bushuev, V. A., Kartsev, A. A., Karavanskiĭ, V. A., Vasil’ev, A. L. (2009) Application of X-ray diffraction methods in the study of micrometer-sized porous Si layers. Crystallography Reports, 54 (3) 379-385 doi:10.1134/s1063774509030031

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Reference TypeJournal (article/letter/editorial)
TitleApplication of X-ray diffraction methods in the study of micrometer-sized porous Si layers
JournalCrystallography Reports
AuthorsLomov, A. A.Author
Bushuev, V. A.Author
Kartsev, A. A.Author
Karavanskiĭ, V. A.Author
Vasil’ev, A. L.Author
Year2009 (May)Volume54
Issue3
PublisherPleiades Publishing Ltd
DOIdoi:10.1134/s1063774509030031Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID618702Long-form Identifiermindat:1:5:618702:0
GUID0
Full ReferenceLomov, A. A., Bushuev, V. A., Kartsev, A. A., Karavanskiĭ, V. A., Vasil’ev, A. L. (2009) Application of X-ray diffraction methods in the study of micrometer-sized porous Si layers. Crystallography Reports, 54 (3) 379-385 doi:10.1134/s1063774509030031
Plain TextLomov, A. A., Bushuev, V. A., Kartsev, A. A., Karavanskiĭ, V. A., Vasil’ev, A. L. (2009) Application of X-ray diffraction methods in the study of micrometer-sized porous Si layers. Crystallography Reports, 54 (3) 379-385 doi:10.1134/s1063774509030031
In(2009, May) Crystallography Reports Vol. 54 (3) Pleiades Publishing Ltd

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Lomov, A. A., Karavanskiĭ, V. A., Vasil’ev, A. L., Novikov, D. V. (2008) X-ray diffraction study of the morphology and structure of pulse-anodized porous Si multilayers. Crystallography Reports, 53 (5) 742-748 doi:10.1134/s1063774508050039
Lomov, A. A., Punegov, V. I., Vasil’ev, A. L., Nohavica, D., Gladkov, P., Kartsev, A. A., Novikov, D. V. (2010) X-ray diffraction analysis of multilayer porous InP(001) structure. Crystallography Reports, 55 (2) 182-190 doi:10.1134/s1063774510020033
Lomov, A. A., Bushuev, V. A., Karavanskii, V. A. (2000) Study of surface and interface roughnesses in porous silicon by high-resolution X-ray methods. Crystallography Reports, 45 (5) 842-847 doi:10.1134/1.1312933
Lomov, A. A., Bushuev, V. A., Karavanskii, V. A., Bayliss, S. (2003) Characterization of the structure of porous germanium layers by high-resolution X-ray diffractometry. Crystallography Reports, 48 (2) 326-334 doi:10.1134/1.1564216
Lomov, A. A., Punegov, V. I., Karavanskii, V. A., Vasil’ev, A. L. (2012) X-ray scattering by porous silicon modulated structures. Crystallography Reports, 57 (2) 185-192 doi:10.1134/s1063774511060162
Bushuev, V. A., Lomov, A. A., Sutyrin, A. G. (2002) Reconstruction of the surface layer density profile by the X-ray reflectometry method. Crystallography Reports, 47 (4) 683-690 doi:10.1134/1.1496071
Lomov, A. A., Myakonkikh, A. V., Rudenko, K. V., Chesnokov, Yu. M. (2014) X-ray reflectometry of the specific features of structural distortions of He+-implanted Si(001) surface layers. Crystallography Reports, 59 (3) 331-337 doi:10.1134/s1063774514020138
Bushuev, V. A. (2023) Statistical Theory of X-ray Diffraction Phase Contrast Formation. Crystallography Reports, 68 (3) 388-395 doi:10.1134/s1063774523700074
Bushuev, V. A., Oreshko, A. P. (2023) Recurrent Relations in Grazing Noncoplanar X-ray Diffraction in Multilayer Surface Crystal Structures. Crystallography Reports, 68 (3) 396-401 doi:10.1134/s1063774523700086
Lomov, A. A., Karavanskii, V. A., Imamov, R. M., Sutyrin, A. G., Dravin, V. A. (2002) Structure of porous surface layers of single-crystal GaAs(001) wafers from data of X-ray diffractometry and reflectometry. Crystallography Reports, 47 (6) 1051-1057 doi:10.1134/1.1523526
Bushuev, V. A., Oreshko, A. P. (2003) X-ray specular reflection under conditions of extremely asymmetric noncoplanar diffraction from a bicrystal. Crystallography Reports, 48 (2) 180-186 doi:10.1134/1.1564191
 
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