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Golovin, Yu. I., Dmitrievskiĭ, A. A., Suchkova, N. Yu. (2006) Structure of complexes responsible for radiation-stimulated softening of silicon single crystals. Physics of the Solid State, 48. 279-282 doi:10.1134/s1063783406020144

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Reference TypeJournal (article/letter/editorial)
TitleStructure of complexes responsible for radiation-stimulated softening of silicon single crystals
JournalPhysics of the Solid State
AuthorsGolovin, Yu. I.Author
Dmitrievskiĭ, A. A.Author
Suchkova, N. Yu.Author
Year2006 (February)Volume48
PublisherPleiades Publishing Ltd
DOIdoi:10.1134/s1063783406020144Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID6152525Long-form Identifiermindat:1:5:6152525:8
GUID0
Full ReferenceGolovin, Yu. I., Dmitrievskiĭ, A. A., Suchkova, N. Yu. (2006) Structure of complexes responsible for radiation-stimulated softening of silicon single crystals. Physics of the Solid State, 48. 279-282 doi:10.1134/s1063783406020144
Plain TextGolovin, Yu. I., Dmitrievskiĭ, A. A., Suchkova, N. Yu. (2006) Structure of complexes responsible for radiation-stimulated softening of silicon single crystals. Physics of the Solid State, 48. 279-282 doi:10.1134/s1063783406020144
In(n.d.) Physics of the Solid State Vol. 48. Pleiades Publishing Ltd

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Golovin, Yu. I., Dmitrievskiĭ, A. A., Suchkova, N. Yu. (2008) Influence of the type and concentration of a dopant on the dynamics of the beta-induced variation in the microhardness of silicon. Physics of the Solid State, 50. 25-27 doi:10.1134/s106378340801006x
Golovin, Yu. I., Dmitrievskiĭ, A. A., Ivanov, V. E., Suchkova, N. Yu., Tolotaev, M. Yu. (2007) Effect of weak magnetic fields on the dynamics of variation in the microhardness of silicon under low-intensity beta irradiation. Physics of the Solid State, 49. 865-867 doi:10.1134/s1063783407050101
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