| Reference Type | Journal (article/letter/editorial) |
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| Title | Effect of sample thickness on electron emission from the TGS ferroelectric crystal |
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| Journal | Physics of the Solid State |
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| Authors | Sidorkin, A. S. | Author |
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| Ponomareva, N. Yu. | Author |
| Milovidova, S. D. | Author |
| Sigov, A. S. | Author |
| Year | 2000 (April) | Volume | 42 |
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| Publisher | Pleiades Publishing Ltd |
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| DOI | doi:10.1134/1.1131283Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 6150145 | Long-form Identifier | mindat:1:5:6150145:2 |
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| GUID | 0 |
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| Full Reference | Sidorkin, A. S., Ponomareva, N. Yu., Milovidova, S. D., Sigov, A. S. (2000) Effect of sample thickness on electron emission from the TGS ferroelectric crystal. Physics of the Solid State, 42. 739-742 doi:10.1134/1.1131283 |
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| Plain Text | Sidorkin, A. S., Ponomareva, N. Yu., Milovidova, S. D., Sigov, A. S. (2000) Effect of sample thickness on electron emission from the TGS ferroelectric crystal. Physics of the Solid State, 42. 739-742 doi:10.1134/1.1131283 |
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| In | (n.d.) Physics of the Solid State Vol. 42. Pleiades Publishing Ltd |
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