| Reference Type | Journal (article/letter/editorial) |
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| Title | Fabrication of Step-and-Flash Imprint Lithography (S-FIL) templates using XeF2 enhanced focused ion-beam etching |
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| Journal | Applied Physics A |
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| Authors | Kettle, J. | Author |
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| Hoyle, R. T. | Author |
| Dimov, S. | Author |
| Year | 2009 (September) | Volume | 96 |
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| Publisher | Springer Science and Business Media LLC |
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| DOI | doi:10.1007/s00339-009-5319-7Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 6014107 | Long-form Identifier | mindat:1:5:6014107:7 |
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| GUID | 0 |
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| Full Reference | Kettle, J., Hoyle, R. T., Dimov, S. (2009) Fabrication of Step-and-Flash Imprint Lithography (S-FIL) templates using XeF2 enhanced focused ion-beam etching. Applied Physics A, 96. 819-825 doi:10.1007/s00339-009-5319-7 |
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| Plain Text | Kettle, J., Hoyle, R. T., Dimov, S. (2009) Fabrication of Step-and-Flash Imprint Lithography (S-FIL) templates using XeF2 enhanced focused ion-beam etching. Applied Physics A, 96. 819-825 doi:10.1007/s00339-009-5319-7 |
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| In | (2009) Applied Physics A Vol. 96. Springer Science and Business Media LLC |
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