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Hamann, Thomas W., Gstrein, Florian, Brunschwig, Bruce S., Lewis, Nathan S. (2006) Measurement of the driving force dependence of interfacial charge-transfer rate constants in response to pH changes at n-ZnO/H2O interfaces. Chemical Physics, 326. 15-23 doi:10.1016/j.chemphys.2006.02.027

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Reference TypeJournal (article/letter/editorial)
TitleMeasurement of the driving force dependence of interfacial charge-transfer rate constants in response to pH changes at n-ZnO/H2O interfaces
JournalChemical Physics
AuthorsHamann, Thomas W.Author
Gstrein, FlorianAuthor
Brunschwig, Bruce S.Author
Lewis, Nathan S.Author
Year2006 (July)Volume326
PublisherElsevier BV
DOIdoi:10.1016/j.chemphys.2006.02.027Search in ResearchGate
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Mindat Ref. ID5960657Long-form Identifiermindat:1:5:5960657:8
GUID0
Full ReferenceHamann, Thomas W., Gstrein, Florian, Brunschwig, Bruce S., Lewis, Nathan S. (2006) Measurement of the driving force dependence of interfacial charge-transfer rate constants in response to pH changes at n-ZnO/H2O interfaces. Chemical Physics, 326. 15-23 doi:10.1016/j.chemphys.2006.02.027
Plain TextHamann, Thomas W., Gstrein, Florian, Brunschwig, Bruce S., Lewis, Nathan S. (2006) Measurement of the driving force dependence of interfacial charge-transfer rate constants in response to pH changes at n-ZnO/H2O interfaces. Chemical Physics, 326. 15-23 doi:10.1016/j.chemphys.2006.02.027
In(n.d.) Chemical Physics Vol. 326. Elsevier BV

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Hamann, Thomas W., Gstrein, Florian, Brunschwig, Bruce S., Lewis, Nathan S. (2005) Measurement of the Dependence of Interfacial Charge-Transfer Rate Constants on the Reorganization Energy of Redox Species at n-ZnO/H2O Interfaces. Journal Of The American Chemical Society, 127 (40) 13949-13954 doi:10.1021/ja0515452
Hamann, Thomas W., Gstrein, Florian, Brunschwig, Bruce S., Lewis, Nathan S. (2005) Measurement of the Free-Energy Dependence of Interfacial Charge-Transfer Rate Constants using ZnO/H2O Semiconductor/Liquid Contacts. Journal Of The American Chemical Society, 127 (21) 7815-7824 doi:10.1021/ja0436188
Royea, William J., Hamann, Thomas W., Brunschwig, Bruce S., Lewis, Nathan S. (2006) A Comparison between Interfacial Electron-Transfer Rate Constants at Metallic and Graphite Electrodes. The Journal of Physical Chemistry B, 110 (39). 19433-19442 doi:10.1021/jp062141e
Hamann, Thomas W., Brunschwig, Bruce S., Lewis, Nathan S. (2006) Comparison of the Self-Exchange and Interfacial Charge-Transfer Rate Constants for Methyl- versustert-Butyl-Substituted Os(III) Polypyridyl Complexes†. The Journal of Physical Chemistry B, 110 (50). 25514-25520 doi:10.1021/jp0649697
Creutz, Carol, Brunschwig, Bruce S., Sutin, Norman (2006) Interfacial charge transfer absorption: Application to metal–molecule assemblies. Chemical Physics, 324. 244-258 doi:10.1016/j.chemphys.2005.12.015
Pomykal, Katherine E., Lewis, Nathan S. (1997) Measurement of Interfacial Charge-Transfer Rate Constants at n-Type InP/CH3OH Junctions. The Journal of Physical Chemistry B, 101 (14). 2476-2484 doi:10.1021/jp962570k
Hamann, Thomas W., Lewis, Nathan S. (2006) Control of the Stability, Electron-Transfer Kinetics, and pH-Dependent Energetics of Si/H2O Interfaces through Methyl Termination of Si(111) Surfaces. The Journal of Physical Chemistry B, 110 (45). 22291-22294 doi:10.1021/jp064401y
Fajardo, Arnel M., Lewis, Nathan S. (1997) Free-Energy Dependence of Electron-Transfer Rate Constants at Si/Liquid Interfaces. The Journal of Physical Chemistry B, 101 (51). 11136-11151 doi:10.1021/jp972087p
Yu, Weilai, Fu, Harold J., Mueller, Thomas, Brunschwig, Bruce S., Lewis, Nathan S. (2020) Atomic force microscopy: Emerging illuminated and operando techniques for solar fuel research. The Journal of Chemical Physics, 153 (2) 20902pp. doi:10.1063/5.0009858
Fajardo, Arnel M., Lewis, Nathan S. (1996) Rate Constants for Charge Transfer Across Semiconductor-Liquid Interfaces. Science, 274 (5289). 969-972 doi:10.1126/science.274.5289.969
Gleason-Rohrer, David C., Brunschwig, Bruce S., Lewis, Nathan S. (2013) Measurement of the Band Bending and Surface Dipole at Chemically Functionalized Si(111)/Vacuum Interfaces. The Journal of Physical Chemistry C, 117 (35). 18031-18042 doi:10.1021/jp401585s
 
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