Redondo-Cubero, A., Corregidor, V., Vázquez, L., Alves, L.C. (2015) Self-consistent depth profiling and imaging of GaN-based transistors using ion microbeams. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 348. 246-250 doi:10.1016/j.nimb.2014.11.040
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Self-consistent depth profiling and imaging of GaN-based transistors using ion microbeams | ||
| Journal | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | ||
| Authors | Redondo-Cubero, A. | Author | |
| Corregidor, V. | Author | ||
| Vázquez, L. | Author | ||
| Alves, L.C. | Author | ||
| Year | 2015 (April) | Volume | 348 |
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/j.nimb.2014.11.040Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 5650686 | Long-form Identifier | mindat:1:5:5650686:0 |
| GUID | 0 | ||
| Full Reference | Redondo-Cubero, A., Corregidor, V., Vázquez, L., Alves, L.C. (2015) Self-consistent depth profiling and imaging of GaN-based transistors using ion microbeams. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 348. 246-250 doi:10.1016/j.nimb.2014.11.040 | ||
| Plain Text | Redondo-Cubero, A., Corregidor, V., Vázquez, L., Alves, L.C. (2015) Self-consistent depth profiling and imaging of GaN-based transistors using ion microbeams. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 348. 246-250 doi:10.1016/j.nimb.2014.11.040 | ||
| In | (2015) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 348. Elsevier BV | ||
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