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Gabelica, Zelimir, Demortier, Guy (1998) RBS and PIXE study of gallium depth profiling in ZSM-5 galloaluminosilicate zeolites. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 136. 1312-1321 doi:10.1016/s0168-583x(97)00827-6

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Reference TypeJournal (article/letter/editorial)
TitleRBS and PIXE study of gallium depth profiling in ZSM-5 galloaluminosilicate zeolites
JournalNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
AuthorsGabelica, ZelimirAuthor
Demortier, GuyAuthor
Year1998 (March)Volume136
PublisherElsevier BV
DOIdoi:10.1016/s0168-583x(97)00827-6Search in ResearchGate
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Mindat Ref. ID5614607Long-form Identifiermindat:1:5:5614607:5
GUID0
Full ReferenceGabelica, Zelimir, Demortier, Guy (1998) RBS and PIXE study of gallium depth profiling in ZSM-5 galloaluminosilicate zeolites. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 136. 1312-1321 doi:10.1016/s0168-583x(97)00827-6
Plain TextGabelica, Zelimir, Demortier, Guy (1998) RBS and PIXE study of gallium depth profiling in ZSM-5 galloaluminosilicate zeolites. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 136. 1312-1321 doi:10.1016/s0168-583x(97)00827-6
In(1998) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 136. Elsevier BV

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Carstanjen, H.D. (1998) Ion beam analysis with monolayer depth resolution. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 136. 1183-1190 doi:10.1016/s0168-583x(97)00899-9
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Ziegler, J.F. (1998) RBS/ERD simulation problems: Stopping powers, nuclear reactions and detector resolution. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 136. 141-146 doi:10.1016/s0168-583x(97)00664-2
Markwitz, A., Demortier, G. (1998) Light element impurities in ion beam bombarded AuAl layers. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 136. 516-520 doi:10.1016/s0168-583x(97)00694-0
Strivay, D., Schoefs, B., Weber, G. (1998) Quantification by PIXE of metallic sites in proteins separated by electrophoresis. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 136. 932-935 doi:10.1016/s0168-583x(97)00786-6
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Terwagne, G, Bodart, F, Demortier, G (1999) Depth profiling of light elements using a nuclear microprobe. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 158 (1). 228-235 doi:10.1016/s0168-583x(99)00514-5
Midy, P., Lagarde, G., Brissaud, I., Frontier, J.P., Chaumont, J. (1998) Study of ion implantation profiles by the PIXE technique. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 136. 551-556 doi:10.1016/s0168-583x(97)00741-6
 
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