Bruner, N.L, Frautschi, M.A, Hoeferkamp, M.R, Seidel, S.C (1995) Characterization procedures for double-sided silicon microstrip detectors. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 362 (2). 315-337 doi:10.1016/0168-9002(95)00280-4
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Characterization procedures for double-sided silicon microstrip detectors | ||
| Journal | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | ||
| Authors | Bruner, N.L | Author | |
| Frautschi, M.A | Author | ||
| Hoeferkamp, M.R | Author | ||
| Seidel, S.C | Author | ||
| Year | 1995 (August) | Volume | 362 |
| Issue | 2 | ||
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/0168-9002(95)00280-4Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 5456581 | Long-form Identifier | mindat:1:5:5456581:4 |
| GUID | 0 | ||
| Full Reference | Bruner, N.L, Frautschi, M.A, Hoeferkamp, M.R, Seidel, S.C (1995) Characterization procedures for double-sided silicon microstrip detectors. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 362 (2). 315-337 doi:10.1016/0168-9002(95)00280-4 | ||
| Plain Text | Bruner, N.L, Frautschi, M.A, Hoeferkamp, M.R, Seidel, S.C (1995) Characterization procedures for double-sided silicon microstrip detectors. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 362 (2). 315-337 doi:10.1016/0168-9002(95)00280-4 | ||
| In | (1995, August) Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment Vol. 362 (2) Elsevier BV | ||
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