| Reference Type | Journal (article/letter/editorial) |
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| Title | X-ray absorption spectroscopy of silicon dioxide (SiO2) polymorphs: The structural characterization of opal |
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| Journal | American Mineralogist |
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| Authors | Li, Dien | Author |
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| Bancroft, G. M. | Author |
| Kasrai, M. | Author |
| Fleet, M. E. | Author |
| Secco, R. A. | Author |
| Feng, X. H. | Author |
| Tan, K. H. | Author |
| Yang, B. X. | Author |
| Year | 1994 | Volume | 79 |
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| Issue | 7-8 |
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| Publisher | Mineralogical Society of America |
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| Download URL | http://www.minsocam.org/ammin/AM79/AM79_622.pdf+ |
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| Mindat Ref. ID | 529665 | Long-form Identifier | mindat:1:5:529665:5 |
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|
| GUID | 0 |
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| Full Reference | Li, Dien, Bancroft, G. M., Kasrai, M., Fleet, M. E., Secco, R. A., Feng, X. H., Tan, K. H., Yang, B. X. (1994) X-ray absorption spectroscopy of silicon dioxide (SiO2) polymorphs: The structural characterization of opal. American Mineralogist, 79 (7-8) 622-632 |
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| Plain Text | Li, Dien, Bancroft, G. M., Kasrai, M., Fleet, M. E., Secco, R. A., Feng, X. H., Tan, K. H., Yang, B. X. (1994) X-ray absorption spectroscopy of silicon dioxide (SiO2) polymorphs: The structural characterization of opal. American Mineralogist, 79 (7-8) 622-632 |
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| In | (1994) American Mineralogist Vol. 79 (7-8) Mineralogical Society of America |
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