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Fleming, A. J., Surnev, S., Netzer, F. P. (2007) Atomic force microscopy and photoemission electron microscopy study of the low-pressure oxidation of transition metal nitrides. Journal of Applied Physics, 102 (8). 84902pp. doi:10.1063/1.2794474

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Reference TypeJournal (article/letter/editorial)
TitleAtomic force microscopy and photoemission electron microscopy study of the low-pressure oxidation of transition metal nitrides
JournalJournal of Applied Physics
AuthorsFleming, A. J.Author
Surnev, S.Author
Netzer, F. P.Author
Year2007 (October 15)Volume102
Issue8
PublisherAIP Publishing
DOIdoi:10.1063/1.2794474Search in ResearchGate
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Mindat Ref. ID5152005Long-form Identifiermindat:1:5:5152005:0
GUID0
Full ReferenceFleming, A. J., Surnev, S., Netzer, F. P. (2007) Atomic force microscopy and photoemission electron microscopy study of the low-pressure oxidation of transition metal nitrides. Journal of Applied Physics, 102 (8). 84902pp. doi:10.1063/1.2794474
Plain TextFleming, A. J., Surnev, S., Netzer, F. P. (2007) Atomic force microscopy and photoemission electron microscopy study of the low-pressure oxidation of transition metal nitrides. Journal of Applied Physics, 102 (8). 84902pp. doi:10.1063/1.2794474
In(2007, October) Journal of Applied Physics Vol. 102 (8) AIP Publishing

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