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Jiang, W. G., Feng, X. Q., Yang, G., Yue, Z. X., Nan, C. W. (2007) Influence of thickness and number of dielectric layers on residual stresses in micromultilayer ceramic capacitors. Journal of Applied Physics, 101 (10). 104117pp. doi:10.1063/1.2735412

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Reference TypeJournal (article/letter/editorial)
TitleInfluence of thickness and number of dielectric layers on residual stresses in micromultilayer ceramic capacitors
JournalJournal of Applied Physics
AuthorsJiang, W. G.Author
Feng, X. Q.Author
Yang, G.Author
Yue, Z. X.Author
Nan, C. W.Author
Year2007 (May 15)Volume101
Issue10
PublisherAIP Publishing
DOIdoi:10.1063/1.2735412Search in ResearchGate
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Mindat Ref. ID5145478Long-form Identifiermindat:1:5:5145478:4
GUID0
Full ReferenceJiang, W. G., Feng, X. Q., Yang, G., Yue, Z. X., Nan, C. W. (2007) Influence of thickness and number of dielectric layers on residual stresses in micromultilayer ceramic capacitors. Journal of Applied Physics, 101 (10). 104117pp. doi:10.1063/1.2735412
Plain TextJiang, W. G., Feng, X. Q., Yang, G., Yue, Z. X., Nan, C. W. (2007) Influence of thickness and number of dielectric layers on residual stresses in micromultilayer ceramic capacitors. Journal of Applied Physics, 101 (10). 104117pp. doi:10.1063/1.2735412
In(2007, May) Journal of Applied Physics Vol. 101 (10) AIP Publishing

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