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Sriram, S., Bhaskaran, M., Holland, A. S., Short, K. T., Latella, B. A. (2007) Measurement of high piezoelectric response of strontium-doped lead zirconate titanate thin films using a nanoindenter. Journal of Applied Physics, 101 (10). 104910pp. doi:10.1063/1.2735407

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Reference TypeJournal (article/letter/editorial)
TitleMeasurement of high piezoelectric response of strontium-doped lead zirconate titanate thin films using a nanoindenter
JournalJournal of Applied Physics
AuthorsSriram, S.Author
Bhaskaran, M.Author
Holland, A. S.Author
Short, K. T.Author
Latella, B. A.Author
Year2007 (May 15)Volume101
Issue10
PublisherAIP Publishing
DOIdoi:10.1063/1.2735407Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5145472Long-form Identifiermindat:1:5:5145472:0
GUID0
Full ReferenceSriram, S., Bhaskaran, M., Holland, A. S., Short, K. T., Latella, B. A. (2007) Measurement of high piezoelectric response of strontium-doped lead zirconate titanate thin films using a nanoindenter. Journal of Applied Physics, 101 (10). 104910pp. doi:10.1063/1.2735407
Plain TextSriram, S., Bhaskaran, M., Holland, A. S., Short, K. T., Latella, B. A. (2007) Measurement of high piezoelectric response of strontium-doped lead zirconate titanate thin films using a nanoindenter. Journal of Applied Physics, 101 (10). 104910pp. doi:10.1063/1.2735407
In(2007, May) Journal of Applied Physics Vol. 101 (10) AIP Publishing

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Sriram, S., Bhaskaran, M., Mitchell, D.R.G., Short, K.T., Holland, A.S., Mitchell, A. (2009) Microstructural and Compositional Analysis of Strontium-Doped Lead Zirconate Titanate Thin Films on Gold-Coated Silicon Substrates. Microscopy and Microanalysis, 15 (1). 30-35 doi:10.1017/s1431927609090072
Berfield, T. A., Ong, R. J., Payne, D. A., Sottos, N. R. (2007) Residual stress effects on piezoelectric response of sol-gel derived lead zirconate titanate thin films. Journal of Applied Physics, 101 (2). 24102pp. doi:10.1063/1.2422778
Bhaskaran, M, Sriram, S, Short, K T, Mitchell, D R G, Holland, A S, Reeves, G K (2007) Characterization of C54 titanium silicide thin films by spectroscopy, microscopy and diffraction. Journal of Physics D: Applied Physics, 40. 5213-5219 doi:10.1088/0022-3727/40/17/030
Sivaramakrishnan, S., Mardilovich, P., Mason, A., Roelofs, A., Schmitz-Kempen, T., Tiedke, S. (2013) Electrode size dependence of piezoelectric response of lead zirconate titanate thin films measured by double beam laser interferometry. Applied Physics Letters, 103 (13). 132904pp. doi:10.1063/1.4821948
Dufay, T., Guiffard, B., Thomas, J.-C., Seveno, R. (2015) Transverse piezoelectric coefficient measurement of flexible lead zirconate titanate thin films. Journal of Applied Physics, 117 (20). 204101pp. doi:10.1063/1.4921588
Pintilie, L., Vrejoiu, I., Le Rhun, G., Alexe, M. (2007) Short-circuit photocurrent in epitaxial lead zirconate-titanate thin films. Journal of Applied Physics, 101 (6). 64109pp. doi:10.1063/1.2560217
Cattan, E., Haccart, T., Rémiens, D. (1999) e31 piezoelectric constant measurement of lead zirconate titanate thin films. Journal of Applied Physics, 86 (12). 7017-7023 doi:10.1063/1.371788
Wolf, R. A., Trolier-McKinstry, S. (2004) Temperature dependence of the piezoelectric response in lead zirconate titanate films. Journal of Applied Physics, 95 (3). 1397-1406 doi:10.1063/1.1636530
Koval, V., Reece, M. J., Bushby, A. J. (2005) Ferroelectric/ferroelastic behavior and piezoelectric response of lead zirconate titanate thin films under nanoindentation. Journal of Applied Physics, 97 (7). 74301pp. doi:10.1063/1.1870092
Bastani, Y., Cortés-Peña, A. Y., Wilson, A. D., Gerardin, S., Bagatin, M., Paccagnella, A., Bassiri-Gharb, N. (2013) Effects of high energy x ray and proton irradiation on lead zirconate titanate thin films' dielectric and piezoelectric response. Applied Physics Letters, 102 (19). 192906pp. doi:10.1063/1.4805045
Scott, J. F., Jiang, A. Q., Redfern, S. A. T., Zhang, Ming, Dawber, M. (2003) Infrared spectra and second-harmonic generation in barium strontium titanate and lead zirconate-titanate thin films: “Polaron” artifacts. Journal of Applied Physics, 94 (5). 3333-3344 doi:10.1063/1.1596715
 
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