| Reference Type | Journal (article/letter/editorial) |
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| Title | Electrical and deep-level characterization of GaP1−xNx grown by gas-source molecular beam epitaxy |
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| Journal | Journal of Applied Physics |
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| Authors | Kaneko, M. | Author |
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| Hashizume, T. | Author |
| Odnoblyudov, V. A. | Author |
| Tu, C. W. | Author |
| Year | 2007 (May 15) | Volume | 101 |
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| Issue | 10 |
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| Publisher | AIP Publishing |
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| DOI | doi:10.1063/1.2732451Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 5145331 | Long-form Identifier | mindat:1:5:5145331:4 |
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| GUID | 0 |
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| Full Reference | Kaneko, M., Hashizume, T., Odnoblyudov, V. A., Tu, C. W. (2007) Electrical and deep-level characterization of GaP1−xNx grown by gas-source molecular beam epitaxy. Journal of Applied Physics, 101 (10). 103707pp. doi:10.1063/1.2732451 |
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| Plain Text | Kaneko, M., Hashizume, T., Odnoblyudov, V. A., Tu, C. W. (2007) Electrical and deep-level characterization of GaP1−xNx grown by gas-source molecular beam epitaxy. Journal of Applied Physics, 101 (10). 103707pp. doi:10.1063/1.2732451 |
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| In | (2007, May) Journal of Applied Physics Vol. 101 (10) AIP Publishing |
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